Invention Grant
- Patent Title: Stress relief MEMS structure and package
- Patent Title (中): 应力消除MEMS结构和封装
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Application No.: US14616017Application Date: 2015-02-06
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Publication No.: US09499393B2Publication Date: 2016-11-22
- Inventor: Lei Gu , Stephen F. Bart
- Applicant: MKS Instruments, Inc.
- Applicant Address: US MA Andover
- Assignee: MKS Instruments, Inc.
- Current Assignee: MKS Instruments, Inc.
- Current Assignee Address: US MA Andover
- Agency: Burns & Levinson, LLP
- Agent Joseph M. Maraia; Steven M. Mills
- Main IPC: H01L27/14
- IPC: H01L27/14 ; B81B7/00 ; B81C1/00

Abstract:
Stress relief structures and methods that can be applied to MEMS sensors requiring a hermetic seal and that can be simply manufactured are disclosed. The system includes a sensor having a first surface and a second surface, the second surface being disposed away from the first surface, the second surface also being disposed away from a package surface and located between the first surface and the package surface, a number of support members, each support member extending from the second surface to the package surface, the support members being disposed on and operatively connected to only a portion of the second surface. The support member are configured to reduce stress produced by package-sensor interaction.
Public/Granted literature
- US20160229688A1 STRESS RELIEF MEMS STRUCTURE AND PACKAGE Public/Granted day:2016-08-11
Information query
IPC分类: