Invention Grant
- Patent Title: Optical fiber temperature distribution measurement device and method of measuring optical fiber temperature distribution
- Patent Title (中): 光纤温度分布测量装置及测量光纤温度分布的方法
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Application No.: US14185314Application Date: 2014-02-20
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Publication No.: US09541459B2Publication Date: 2017-01-10
- Inventor: Hideo Shida
- Applicant: YOKOGAWA ELECTRIC CORPORATION
- Applicant Address: JP Tokyo
- Assignee: YOKOGAWA ELECTRIC CORPORATION
- Current Assignee: YOKOGAWA ELECTRIC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2013-038696 20130228
- Main IPC: G01K11/32
- IPC: G01K11/32

Abstract:
An optical fiber temperature distribution measurement device configured to receive Raman back scattering lights obtained by inputting a pulsed light into an optical fiber and to measure a temperature distribution along a longitudinal direction of the optical fiber is provided. The device includes a first filter device. The first filter device includes: a threshold value setting circuit configured to set a threshold value in accordance with a change in an amount of noise overlapped with a measured signal, the measured signal indicating one of an intensity distribution and a temperature distribution of the Raman back scattering lights along the longitudinal direction of the optical fiber; a filter configured to eliminate a frequency component of the measured signal, the frequency component being larger than a predetermined first frequency; a determination circuit configured to determine if the measured signal is over the threshold value; a synthesizing circuit configured to select and synthesize one of the measured signal processed by the filter and the measured signal unprocessed by the filter in accordance with a determination result from the determination circuit.
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