Invention Grant
- Patent Title: Distribution of refractive index measurement by synthetic aperture tomography
- Patent Title (中): 通过合成孔径断层扫描分析折射率测量
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Application No.: US14490242Application Date: 2014-09-18
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Publication No.: US09546952B2Publication Date: 2017-01-17
- Inventor: Wonshik Choi , Ramachandra Dasari , Christopher Fang-Yen , Michael Feld
- Applicant: Massachusetts Institute of Technology
- Applicant Address: US MA Cambridge
- Assignee: Massachusetts Institute of Technology
- Current Assignee: Massachusetts Institute of Technology
- Current Assignee Address: US MA Cambridge
- Agency: McCarter & English, LLP
- Main IPC: G01N21/45
- IPC: G01N21/45 ; G01N21/51 ; G01N21/64

Abstract:
The present invention relates to systems and methods for quantitative three-dimensional mapping of refractive index in living or non-living cells, tissues, or organisms using a phase-shifting laser interferometric microscope with variable illumination angle. A preferred embodiment provides tomographic imaging of cells and multicellular organisms, and time-dependent changes in cell structure and the quantitative characterization of specimen-induced aberrations in high-resolution microscopy with multiple applications in tissue light scattering.
Public/Granted literature
- US20150177133A1 TOMOGRAPHIC PHASE MICROSCOPY Public/Granted day:2015-06-25
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