Invention Grant
US09551677B2 Angle calibration for grazing-incidence X-ray fluorescence (GIXRF)
有权
放射X射线荧光角度校准(GIXRF)
- Patent Title: Angle calibration for grazing-incidence X-ray fluorescence (GIXRF)
- Patent Title (中): 放射X射线荧光角度校准(GIXRF)
-
Application No.: US14555613Application Date: 2014-11-27
-
Publication No.: US09551677B2Publication Date: 2017-01-24
- Inventor: Isaac Mazor , Asher Peled
- Applicant: JORDAN VALLEY SEMICONDUCTORS LTD.
- Applicant Address: IL Migdal Haemek
- Assignee: BRUKER JV ISRAEL LTD.
- Current Assignee: BRUKER JV ISRAEL LTD.
- Current Assignee Address: IL Migdal Haemek
- Agency: D. Kligler IP Services Ltd.
- Main IPC: G01N23/223
- IPC: G01N23/223

Abstract:
A method includes directing an X-ray beam to be incident at a grazing angle on a location on a surface of the sample. An X-ray fluorescence excited at the location is measured. A reflection angle of the X-ray beam from the surface and a transmission angle of the X-ray beam are measured. An angle of incidence of the X-ray beam on the surface is evaluated using the measured reflection and transmission angles, and the measured X-ray fluorescence is analyzed using the evaluated angle of incidence.
Public/Granted literature
- US20150204806A1 ANGLE CALIBRATION FOR GRAZING-INCIDENCE X-RAY FLUORESCENCE (GIXRF) Public/Granted day:2015-07-23
Information query