Invention Grant
- Patent Title: Alignment marking for rock sample analysis
- Patent Title (中): 岩石样品分析对准标记
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Application No.: US14189506Application Date: 2014-02-25
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Publication No.: US09552958B2Publication Date: 2017-01-24
- Inventor: Kultaransingh N. Hooghan
- Applicant: Weatherford/Lamb, Inc.
- Applicant Address: US TX Houston
- Assignee: Weatherford Technology Holdings, LLC
- Current Assignee: Weatherford Technology Holdings, LLC
- Current Assignee Address: US TX Houston
- Agency: Blank Rome LLP
- Main IPC: H01J37/20
- IPC: H01J37/20 ; H01J37/28 ; G01N23/225 ; G01N1/32
Abstract:
A method for using a Focused Ion Beam and/or Scanning Electron Microscope (FIB/SEM) for etching one or more alignment markers on a rock sample, the one or more alignment markers being etched on the rock sample using the FIB/SEM. The one or more alignment markers may further be deposited with a platinum alloy or other suitable compositions for increasing alignment marker visibility.
Public/Granted literature
- US20150243471A1 Alignment Marking for Rock Sample Analysis Public/Granted day:2015-08-27
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