Invention Grant
- Patent Title: Systems, devices, and methods for calibration of beam profilers
- Patent Title (中): 用于光束分析仪校准的系统,设备和方法
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Application No.: US14808869Application Date: 2015-07-24
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Publication No.: US09572715B2Publication Date: 2017-02-21
- Inventor: Ihor Berezhnyy , Anthony Tang , Henry Price
- Applicant: AMO Manufacturing USA, LLC
- Applicant Address: US CA Santa Ana
- Assignee: AMO Manufacturing USA, LLC
- Current Assignee: AMO Manufacturing USA, LLC
- Current Assignee Address: US CA Santa Ana
- Agency: Abbott Medical Optics Inc.
- Main IPC: G01J1/00
- IPC: G01J1/00 ; A61F9/008 ; G01J1/42 ; G01M11/06 ; G01J1/58

Abstract:
Embodiments generally describe systems, devices, and methods for focusing and calibrating beam profilers. A test object is provided that may include an internal housing rotatable within an external housing. The internal housing may house a light source, a collimator, a filter, and/or a diffuser. A plate may be mounted to the internal housing and may include a plurality of markings. In some embodiments, to focus a beam profiler, the test object may be positioned adjacent the converter plate of a beam profiler. Marker images may be captured and a focus quality may be assessed therefrom. A position of the converter, objective, and/or camera of the beam profiler may be adjusted based on the focus quality. To calibrate, images of the markings in several rotational positions may be captured and used for calibration. The markings may be rotated to several positions by rotating the internal housing relative to the external housing.
Public/Granted literature
- US20160025555A1 Systems, Devices, and Methods for Calibration of Beam Profilers Public/Granted day:2016-01-28
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