Invention Grant
- Patent Title: Method for adaptive feedback controlled polishing
- Patent Title (中): 自适应反馈控制抛光方法
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Application No.: US14532338Application Date: 2014-11-04
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Publication No.: US09573243B2Publication Date: 2017-02-21
- Inventor: Terry Moore , Brant Nease
- Applicant: Headway Technologies, Inc.
- Applicant Address: US CA Milpitas
- Assignee: Headway Technologies, Inc.
- Current Assignee: Headway Technologies, Inc.
- Current Assignee Address: US CA Milpitas
- Agency: Saile Ackerman LLC
- Agent Stephen B. Ackerman
- Main IPC: C03C15/00
- IPC: C03C15/00 ; C03C25/68 ; H01L21/302 ; H01L21/461 ; H01L21/311 ; B24B37/013 ; B24B49/12 ; H01L21/321 ; H01L21/3105 ; H01L21/66 ; B81C99/00

Abstract:
An adaptive feedback control method is provided for a chemical mechanical polish process to minimize a dielectric layer clearing time difference between two annular regions on a substrate. An optical system with an optical window passes below the polishing pad and detects reflected light interference signals from at least two annular regions. A pre-clearing time difference is determined and is used to calculate an adjustment to one or both of a CMP head membrane pressure and a retaining ring pressure. The pressure adjustment is applied before the end of the polish cycle to avoid the need for a second polish cycle and to reduce a dishing difference and a resistance difference in a metal layer in the at least two annular regions. In some embodiments, a second pressure adjustment is performed before the end of the cycle and different CMP head membrane pressure adjustments are made in different pressure zones.
Public/Granted literature
- US20160121451A1 Method for Adaptive Feedback Controlled Polishing Public/Granted day:2016-05-05
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