Invention Grant
- Patent Title: Spectroscopy system with displacement compensation and spectroscopy method using the spectroscopy system
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Application No.: US14934722Application Date: 2015-11-06
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Publication No.: US09599509B2Publication Date: 2017-03-21
- Inventor: Peter Peumans , Seongho Cho , Woochang Lee
- Applicant: SAMSUNG ELECTRONICS CO., LTD. , IMEC VZW
- Applicant Address: KR Suwon-si BE Leuven
- Assignee: SAMSUNG ELECTRONICS CO., LTD.,IMEC VZW
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.,IMEC VZW
- Current Assignee Address: KR Suwon-si BE Leuven
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2014-0154735 20141107
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01J3/02 ; G01J3/44 ; A61B5/00 ; G01N21/359 ; G01N21/65 ; A61B5/11 ; A61B5/145 ; G01J3/28
Abstract:
A spectroscopy system includes detectors configured to obtain detection spectrums of respective detection areas that are located at different positions of an object; and an information processor configured to obtain a target spectrum of a target area by using position information of the detection areas and the detection spectrums obtained by the detectors.
Public/Granted literature
- US20160131523A1 SPECTROSCOPY SYSTEM WITH DISPLACEMENT COMPENSATION AND SPECTROSCOPY METHOD USING THE SPECTROSCOPY SYSTEM Public/Granted day:2016-05-12
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