Invention Grant
- Patent Title: Peak detection method for mass spectrometry and system therefor
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Application No.: US13872466Application Date: 2013-04-29
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Publication No.: US09613786B2Publication Date: 2017-04-04
- Inventor: Jingwen Yao
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: Sughrue Mion, PLLC
- Priority: JP2012-243103 20121102
- Main IPC: G01N31/00
- IPC: G01N31/00 ; H01J49/00 ; G06F19/00

Abstract:
To enable more reliable detection of ion peaks from mass spectral data. Ion peaks are detected from mass spectrum by the following steps. A step of acquiring mass spectral data made up of peaks which is acquired using a mass spectrometer, the peaks having mass-to-charge ratio and intensity information, a step of classifying the peaks in the acquired mass spectral data into a plurality of classes according to the intensity of the peaks, and a step of identifying the peaks as ion peaks or noise peaks based on the intensity information of the peaks which have been classified into the plurality of classes.
Public/Granted literature
- US20130311109A1 PEAK DETECTION METHOD FOR MASS SPECTROMETRY AND SYSTEM THEREFOR Public/Granted day:2013-11-21
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