Invention Grant
- Patent Title: Adjustment circuit and method for measuring optical parameter and optical measurement system
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Application No.: US14406255Application Date: 2014-10-17
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Publication No.: US09618388B2Publication Date: 2017-04-11
- Inventor: Jian He , Shen-Sian Syu , Yugang Bao
- Applicant: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Applicant Address: CN Shenzhen
- Assignee: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Shenzhen
- Agency: Sughrue Mion, PLLC
- Priority: CN201410513600 20140929
- International Application: PCT/CN2014/088807 WO 20141017
- International Announcement: WO2016/049949 WO 20160407
- Main IPC: H03F3/08
- IPC: H03F3/08 ; G01J1/44 ; G01M11/02

Abstract:
An adjustment circuit for measuring an optical parameter is disclosed. The adjustment circuit includes an optical sensing module for detecting an optical signal and converting the detected optical signal into a voltage signal; an amplification module for amplifying the voltage signal; an A/D conversion module for converting the amplified voltage signal into a digital signal; a control module for analyzing the digital signal for generating an analyzed result; a signal generating module for outputting a frequency square wave signal according to the analyzed result; and an adjustment module for adjusting an amplification factor of the amplification module according to the frequency square wave signal. The circuit of the present disclosure is easy, and an automatic measurement can be implemented.
Public/Granted literature
- US20160265967A1 ADJUSTMENT CIRCUIT AND METHOD FOR MEASURING OPTICAL PARAMETER AND OPTICAL MEASUREMENT SYSTEM Public/Granted day:2016-09-15
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