Invention Grant
- Patent Title: Mathematical image assembly in a scanning-type microscope
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Application No.: US14743780Application Date: 2015-06-18
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Publication No.: US09620330B2Publication Date: 2017-04-11
- Inventor: Pavel Poto{hacek over (c)}ek , Cornelis Sander Kooijman , Hendrik Nicolaas Slingerland , Gerard Nicolaas Anne van Veen , Faysal Boughorbel
- Applicant: FEI Company
- Applicant Address: US OR Hillsboro
- Assignee: FEI Company
- Current Assignee: FEI Company
- Current Assignee Address: US OR Hillsboro
- Agency: Scheinberg & Associates, P.C.
- Agent Michael O. Scheinberg; John E. Hillert
- Priority: EP14172871 20140618
- Main IPC: H01J37/28
- IPC: H01J37/28 ; G02B21/00 ; H01J37/22

Abstract:
A method and apparatus for imaging a specimen using a scanning-type microscope, by irradiating a specimen with a beam of radiation using a scanning motion, and detecting a flux of radiation emanating from the specimen in response to the irradiation, in the first sampling session {S1} of a set {Sn}, gathering data from a first collection of sparsely distributed sampling points {P1} of set {Pn}. A mathematical registration correction is made to compensate for drift mismatches between different members of the set {Pn}, and an image of the specimen is assembled using the set {Pn} as input to an integrative mathematical reconstruction procedure.
Public/Granted literature
- US20150371815A1 MATHEMATICAL IMAGE ASSEMBLY IN A SCANNING-TYPE MICROSCOPE Public/Granted day:2015-12-24
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