Invention Grant
- Patent Title: X-ray apparatus
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Application No.: US14547976Application Date: 2014-11-19
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Publication No.: US09640292B2Publication Date: 2017-05-02
- Inventor: Detlef Beckers , Stjepan Prugovecki
- Applicant: PANalytical B.V.
- Applicant Address: NL Almelo
- Assignee: PANALYTICAL B.V.
- Current Assignee: PANALYTICAL B.V.
- Current Assignee Address: NL Almelo
- Agency: Leason Ellis LLP
- Priority: EP14151339 20140115
- Main IPC: G01T1/36
- IPC: G01T1/36 ; G21K1/04 ; G01N23/201 ; G01N23/207
Abstract:
X-ray diffraction apparatus includes a flat graded multilayer 8 which may be used in a SAXS configuration for a sample 6. The apparatus may be adapted for Bragg-Brentano measurements by a collimator 16 without the need for alternate beam paths or complex arrangements.
Public/Granted literature
- US20150200030A1 X-RAY APPARATUS Public/Granted day:2015-07-16
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