Invention Grant
- Patent Title: Componential analysis method, componential analysis apparatus and non-transitory computer-readable recording medium
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Application No.: US14199732Application Date: 2014-03-06
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Publication No.: US09645086B2Publication Date: 2017-05-09
- Inventor: Takehiro Nakai
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Tokyo
- Agency: Holtz, Holtz & Volek PC
- Main IPC: G01J3/44
- IPC: G01J3/44 ; G01N21/65

Abstract:
In accordance with an embodiment, a componential analysis method includes dividing a sample structure into at least a first layer to be analyzed and a second layer located closer to a surface layer of the sample than the first layer, applying, to the sample, laser lights of first and second wavelengths respectively corresponding to the depths of the first and second layers, detecting Raman scattered lights respectively obtained from the sample by the application of the laser lights and then outputting first and second Raman signals, spectrally processing the first and second Raman signals to acquire first and second Raman spectrums, acquiring a differential spectrum by subtracting the second Raman spectrum from the first Raman spectrum, and analyzing the differential spectrum.
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