- Patent Title: Microprocessor-assisted calibration for analog-to-digital converter
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Application No.: US14955888Application Date: 2015-12-01
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Publication No.: US09654133B2Publication Date: 2017-05-16
- Inventor: Carroll C. Speir , Eric Otte , Nevena Rakuljic , Jeffrey Paul Bray
- Applicant: ANALOG DEVICES, INC.
- Applicant Address: US MA Norwood
- Assignee: ANALOG DEVICES, INC.
- Current Assignee: ANALOG DEVICES, INC.
- Current Assignee Address: US MA Norwood
- Agency: Patent Capital Group
- Main IPC: H03M1/10
- IPC: H03M1/10 ; H03M1/12 ; H03M1/46 ; H03M3/00

Abstract:
Analog-to-digital converters (ADCs) can have errors which can affect their performance. To improve the performance, many techniques have been used to compensate or correct for the errors. When the ADCs are being implemented with sub-micron technology, ADCs can be readily and easily equipped with an on-chip microprocessor for performing a variety of digital functions. The on-chip microprocessor and any suitable digital circuitry can implement functions for reducing those errors, enabling certain undesirable artifacts to be reduced, and providing a flexible platform for a highly configurable ADC. The on-chip microprocessor is particularly useful for a randomized time-interleaved ADC. Moreover, a randomly sampling ADC can be added in parallel to a main ADC for calibration purposes. Furthermore, the overall system can include an efficient implementation for correcting errors in an ADC.
Public/Granted literature
- US20160182074A1 MICROPROCESSOR-ASSISTED CALIBRATION FOR ANALOG-TO-DIGITAL CONVERTER Public/Granted day:2016-06-23
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