Invention Grant
- Patent Title: Characterization of polymer and colloid solutions
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Application No.: US14464658Application Date: 2014-08-20
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Publication No.: US09664608B2Publication Date: 2017-05-30
- Inventor: Wayne Frederick Reed , Michael Felix Drenski , Alex Wayne Reed
- Applicant: ADVANCED POLYMER MONITORING TECHNOLOGIES, INC.
- Applicant Address: US LA New Orleans US LA New Orleans
- Assignee: ADVANCED POLYMER MONITORING TECHNOLOGIES, INC.,THE ADMINISTRATORS OF THE TULANE EDUCATIONAL FUND
- Current Assignee: ADVANCED POLYMER MONITORING TECHNOLOGIES, INC.,THE ADMINISTRATORS OF THE TULANE EDUCATIONAL FUND
- Current Assignee Address: US LA New Orleans US LA New Orleans
- Agency: Polsinelli PC
- Main IPC: G01N15/02
- IPC: G01N15/02 ; G01N21/51 ; G01N21/75 ; G01N33/68 ; G01N21/53 ; G01N21/47

Abstract:
Simultaneous Multiple Sample Light Scattering systems and methods can be used for polymer stability testing and for applying stressors to polymer or colloid solutions including heat stress, ultrasound, freeze/thaw cycles, shear stress and exposure to different substances and surfaces, among others, that create a polymer stress response used to characterize the polymer solution and stability.
Public/Granted literature
- US20150056710A1 CHARACTERIZATION OF POLYMER AND COLLOID SOLUTIONS Public/Granted day:2015-02-26
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