Invention Grant
- Patent Title: Ion source, and mass analysis apparatus including same
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Application No.: US14442283Application Date: 2013-08-20
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Publication No.: US09673035B2Publication Date: 2017-06-06
- Inventor: Chang Joon Park , Jong Rok Ahn , Cheolsu Han , Sang Jung Ahn
- Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
- Applicant Address: KR Daejeon
- Assignee: Korea Research Insitute of Standards and Science
- Current Assignee: Korea Research Insitute of Standards and Science
- Current Assignee Address: KR Daejeon
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2012-0127690 20121112
- International Application: PCT/KR2013/007445 WO 20130820
- International Announcement: WO2014/073778 WO 20140515
- Main IPC: H01J49/14
- IPC: H01J49/14 ; H01J49/06 ; H01J49/16

Abstract:
According to one embodiment of the present invention, an ion source includes: an anode tube in which gas flowing in through one side is ionized and discharged to the other side and in which a slit is formed on the outer circumference thereof; a filament which emits thermal electrons toward the slit so as to ionize the gas; and a diffusion-preventing body arranged between the filament and the slit and having at least one hole through which the thermal electrons can pass so as to reduce the diffusion of the thermal electrons flowing into the anode tube.
Public/Granted literature
- US20160225600A1 ION SOURCE, AND MASS ANALYSIS APPARATUS INCLUDING SAME Public/Granted day:2016-08-04
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