Invention Grant
- Patent Title: Apparatus for analyzing elements in liquid with controlled amount of gas supply for plasma generation
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Application No.: US14184233Application Date: 2014-02-19
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Publication No.: US09677940B2Publication Date: 2017-06-13
- Inventor: Hironori Kumagai , Shin-ichi Imai
- Applicant: PANASONIC CORPORATION
- Applicant Address: JP Osaka
- Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JP2012-145843 20120628
- Main IPC: G01J3/443
- IPC: G01J3/443 ; G01N21/67 ; G01N21/69

Abstract:
An elemental analysis apparatus 101 includes a treatment vessel 108 of which at least a part is optically transparent, a first electrode 104 covered by insulator 103, a second electrode 102, a bubble-generating part which generates a bubble 106, a gas-supplying apparatus 105 which supplies gas to the bubble-generating part in an amount necessary for generating the bubble 106, a power supply 101 which applies voltage between the first electrode 104 and the second electrode 102, and an optical detection device 110 which determines an emission spectrum of plasma that is generated by application of the voltage, and the apparatus conducts qualitatively or quantitatively analysis of a component contained in the liquid 109 based on the emission spectrum determined by the optical detection device 110.
Public/Granted literature
- US20140168644A1 APPARATUS FOR ANALYZING ELEMENTS IN LIQUID Public/Granted day:2014-06-19
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