- Patent Title: Method for preparing a nanoporous ultra-low dielectric thin film including a high-temperature ozone treatment and a nanoporous ultra-low dielectric thin film prepared by the same method
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Application No.: US13570596Application Date: 2012-08-09
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Publication No.: US09679761B2Publication Date: 2017-06-13
- Inventor: Hee Woo Rhee , Bo Ra Shin , Kyu Yoon Choi , Bum Suk Kim
- Applicant: Hee Woo Rhee , Bo Ra Shin , Kyu Yoon Choi , Bum Suk Kim
- Applicant Address: KR Seoul KR Seoul
- Assignee: INDUSTRY-UNIVERSITY COOPERATION FOUNDATION,SOGANG UNIVERSITY
- Current Assignee: INDUSTRY-UNIVERSITY COOPERATION FOUNDATION,SOGANG UNIVERSITY
- Current Assignee Address: KR Seoul KR Seoul
- Agency: Brundidge & Stanger, P.C.
- Priority: KR10-2010-0011830 20100209
- Main IPC: B05D3/04
- IPC: B05D3/04 ; H01L21/02 ; C23C18/12 ; B32B5/00

Abstract:
The present invention provides a method for preparing a nanoporous ultra-low dielectric thin film including a high-temperature ozone treatment and nanoporous ultra-low dielectric thin film prepared by the same method. The method includes preparing a mixture of an organic silicate matrix-containing solution and a reactive porogen-containing solution; coating the mixture on a substrate to form a thin film; and heating the thin film with an ozone treatment. The prepared nanoporous ultra-low dielectric thin film could have a dielectric constant of about 2.3 or less and a mechanical strength of about 10 GPa or more by improving a pore size and a distribution of pores in the thin film by performing an ozone treatment with high temperature and optimization of the ozone treatment temperature.
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