Invention Grant
- Patent Title: Extended temperature range mapping process of a furnace enclosure using various device settings
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Application No.: US14306063Application Date: 2014-06-16
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Publication No.: US09696210B2Publication Date: 2017-07-04
- Inventor: Sharath Venkatesha , Kwong W. Au , Stefano Bietto
- Applicant: Honeywell International Inc.
- Applicant Address: US NJ Morristown
- Assignee: Honeywell International Inc.
- Current Assignee: Honeywell International Inc.
- Current Assignee Address: US NJ Morristown
- Main IPC: G01J5/00
- IPC: G01J5/00 ; G01J5/10 ; G01J5/60 ; G06T5/00 ; G01J5/06

Abstract:
A process is provided for mapping temperatures in an enclosure during a combustion process. A device setting of an image-capturing device is provided. An intensity-temperature mapping is generated by performing an intensity-temperature calibration based on an intensity of an image pixel in a field of view (FOV) generated by the image-capturing device, a corresponding temperature measurement, and a selected device setting. Each emitted radiation of selected regions is detected based on a first image in the FOV. At least one region is determined whether the region is poor responsive, based on the intensity-temperature mapping associated with the device setting. The at least one poor responsive region is replaced with acceptable regions unaffected by the saturation from at least one other image captured at a different device setting for higher temperature resolution.
Public/Granted literature
- US20150362372A1 EXTENDED TEMPERATURE RANGE MAPPING PROCESS OF A FURNACE ENCLOSURE USING VARIOUS DEVICE SETTINGS Public/Granted day:2015-12-17
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