Invention Grant
- Patent Title: Light measuring system
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Application No.: US14804613Application Date: 2015-07-21
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Publication No.: US09702757B2Publication Date: 2017-07-11
- Inventor: Joon Sub Lee , Seung Won Park
- Applicant: SAMSUNG ELECTRONICS CO., LTD.
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2014-0183492 20141218
- Main IPC: G01J1/04
- IPC: G01J1/04 ; G01J1/42 ; G01J3/02 ; G01J1/58
Abstract:
A light measuring system including an integrating sphere having an aperture configured by opposing reflectors selectively aligned with complementary reflectors of at least one light source mounting block having a light source mounting region for mounting a light source thereon.
Public/Granted literature
- US20160178431A1 LIGHT MEASURING SYSTEM Public/Granted day:2016-06-23
Information query
