Invention Grant
- Patent Title: Test apparatus
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Application No.: US14044635Application Date: 2013-10-02
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Publication No.: US09702929B2Publication Date: 2017-07-11
- Inventor: Masahiro Ishida , Satoshi Komatsu , Kunihiro Asada , Toru Nakura
- Applicant: ADVANTEST CORPORATION , The University of Tokyo
- Applicant Address: JP Tokyo JP Tokyo
- Assignee: ADVANTEST CORPORATION,THE UNIVERSITY OF TOKYO
- Current Assignee: ADVANTEST CORPORATION,THE UNIVERSITY OF TOKYO
- Current Assignee Address: JP Tokyo JP Tokyo
- Agency: Cantor Colburn LLP
- Priority: JP2012-221620 20121003
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/28 ; G01R31/317 ; G11C29/56

Abstract:
A judgment unit judges the pass/fail of DUTs. A power supply circuit has changeable characteristics, and supplies a power supply signal to the DUTs. A condition setting unit performs a pilot test before a main test for the DUTs, and acquires a test condition to be used in the main test. The condition setting unit executes: (a) measuring a first device characteristic value for each of multiple pilot samples sampled from among the DUTs while emulating a power supply characteristic close to what is used in a user environment in which the DUT is actually used; (b) measuring a predetermined second device characteristic value for each of the multiple pilot sample devices while emulating a power supply characteristic close to what is used in a tester environment in which the main test is performed; and (c) determining the test condition based on the first and second device characteristic values.
Public/Granted literature
- US20140091830A1 TEST APPARATUS Public/Granted day:2014-04-03
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