Invention Grant
- Patent Title: Variable capacitance device
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Application No.: US15239196Application Date: 2016-08-17
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Publication No.: US09704847B2Publication Date: 2017-07-11
- Inventor: Toshiyuki Nakaiso , Nobuo Sakai
- Applicant: Murata Manufacturing Co., Ltd.
- Applicant Address: JP Nagaokakyo-shi, Kyoto-Fu
- Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee: Murata Manufacturing Co., Ltd.
- Current Assignee Address: JP Nagaokakyo-shi, Kyoto-Fu
- Agency: Arent Fox LLP
- Priority: JP2014-077102 20140403
- Main IPC: H01L27/02
- IPC: H01L27/02 ; H01L27/08 ; B81B7/00 ; H01L29/93 ; H01G7/06 ; H01L49/02

Abstract:
A variable capacitance device that includes a semiconductor substrate, a redistribution layer disposed on a surface of the semiconductor substrate, and a plurality of terminal electrodes including first and second input/output terminals, a ground terminal and a control voltage application terminal. Moreover, a variable capacitance element section is formed in the redistribution layer from a pair of capacitor electrodes connected to the first and second input/output terminals, respectively, and a ferroelectric thin film disposed between the capacitor electrodes. Further, an ESD protection element is connected between the one of the input/output terminals and the ground terminal is formed on the surface of the semiconductor substrate.
Public/Granted literature
- US20160351556A1 VARIABLE CAPACITANCE DEVICE Public/Granted day:2016-12-01
Information query
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