Invention Grant
- Patent Title: Device for measuring polarization degree and refractive index
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Application No.: US14895305Application Date: 2015-06-01
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Publication No.: US09709489B2Publication Date: 2017-07-18
- Inventor: Hideyuki Amamiya , Masanosuke Tanaka
- Applicant: ATAGO CO., LTD.
- Applicant Address: JP
- Assignee: ATAGO CO., LTD.
- Current Assignee: ATAGO CO., LTD.
- Current Assignee Address: JP
- Agency: Brooks Kushman P.C.
- Priority: JP2014-114113 20140602
- International Application: PCT/JP2015/065755 WO 20150601
- International Announcement: WO2015/186655 WO 20151210
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/41 ; G01N33/02 ; G01N21/21 ; G01J4/04 ; G01N21/17

Abstract:
A device includes a sample chamber (1) configured to receive the object, a polarization degree measuring member (2) configured to measure the polarization degree of the object received in the sample chamber (1), and a refractive index measuring member (3) configured to measure information corresponding to the refractive index of the object received in the sample chamber (1). The polarization degree measuring member (2) includes a polarization modulation member (11) configured to perform polarization modulation on a light beam (9) for analyzing the object and allow the modulated light beam to enter the sample chamber (1), an intensity detection member (12) configured to detect an intensity of the light beam (5) exiting from the sample chamber, and a polarization degree calculation member (13). The refractive index measuring member (3) includes a position detection member (26) and a refractive index (concentration) calculation member (13).
Public/Granted literature
- US20170074791A1 DEVICE FOR MEASURING POLARIZATION DEGREE AND REFRACTIVE INDEX Public/Granted day:2017-03-16
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