Invention Grant
- Patent Title: Bond via array for thermal conductivity
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Application No.: US14567918Application Date: 2014-12-11
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Publication No.: US09735084B2Publication Date: 2017-08-15
- Inventor: Rajesh Katkar , Guilian Gao , Charles G. Woychik , Wael Zohni
- Applicant: Invensas Corporation
- Applicant Address: US CA San Jose
- Assignee: Invensas Corporation
- Current Assignee: Invensas Corporation
- Current Assignee Address: US CA San Jose
- Main IPC: H01L23/367
- IPC: H01L23/367 ; H01L23/538 ; H01L21/768 ; H01L23/433 ; H01L25/065 ; H01L23/36

Abstract:
In a microelectronic device, a substrate has first upper and lower surfaces. An integrated circuit die has second upper and lower surfaces. Interconnects couple the first upper surface of the substrate to the second lower surface of the integrated circuit die for electrical communication therebetween. A via array has proximal ends of wires thereof coupled to the second upper surface for conduction of heat away from the integrated circuit die. A molding material is disposed in the via array with distal ends of the wires of the via array extending at least to a superior surface of the molding material.
Public/Granted literature
- US20160172268A1 Bond Via Array for Thermal Conductivity Public/Granted day:2016-06-16
Information query
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