Invention Grant
- Patent Title: Determination of spatial distribution of charged particle beams
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Application No.: US14978845Application Date: 2015-12-22
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Publication No.: US09754360B2Publication Date: 2017-09-05
- Inventor: Eric Lifshin , Yudhishthir Kandel
- Applicant: The Research Foundation for the State University of New York
- Applicant Address: US NY Albany
- Assignee: THE RESEARCH FOUNDATION FOR THE STATE UNIVERSITY OF NEW YORK
- Current Assignee: THE RESEARCH FOUNDATION FOR THE STATE UNIVERSITY OF NEW YORK
- Current Assignee Address: US NY Albany
- Agency: Heslin Rothenberg Farley & Mesiti PC
- Agent Matthew M. Hulihan
- Main IPC: G06T5/00
- IPC: G06T5/00 ; H01J37/28

Abstract:
A point spread function (PSF) of a focused scanning particle beam of an observation instrument is ascertained by obtaining a first image (reference image) based on a reference instrument, the reference image being an image of an area of a reference standard, obtaining a second image (observed image) of the area of the reference standard, and the observed image obtained using the observation instrument configured with a set of operational parameters that define a probe size for the observation instrument, the probe size being larger than a pixel size of the reference image, and then determining, based on the reference image and the observed image, the PSF of the observation instrument as a component of a convolution of the reference image that provides the observed image.
Public/Granted literature
- US20160180190A1 DETERMINATION OF SPATIAL DISTRIBUTION OF CHARGED PARTICLE BEAMS Public/Granted day:2016-06-23
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