Systems and methods are provided for digital-to-analog converters (DACs) with enhanced dynamic element matching (DEM) and calibration. DEM may be adapted based on assessment of one or more conditions that may affect the DACs or DEM functions thereof. The one or more condition may comprise amount of signal backoff. The adaption may comprise switching the DEM function (as a whole, or partially—e.g., individual DEM elements) on or off based on the assess conditions. The DACs may incorporate use of calibration. The DEM and/or the calibration may be applied to only a portion of the DAC, such as a particular segment (e.g., a middle segment comprising bits between the MSBs and the LSBs).