Invention Grant
- Patent Title: Information acquisition apparatus and information acquisition method
-
Application No.: US15041617Application Date: 2016-02-11
-
Publication No.: US09772224B2Publication Date: 2017-09-26
- Inventor: Hideto Ishiguro , Tsukasa Eguchi , Hitoshi Tsuchiya , Megumu Ito
- Applicant: Seiko Epson Corporation
- Applicant Address: JP
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2015-029301 20150218
- Main IPC: G01J1/44
- IPC: G01J1/44 ; A61B5/1495 ; A61B5/00 ; A61B5/1455 ; A61B5/024 ; G01N21/47 ; G01N21/31
Abstract:
A component measurement apparatus includes: a sensor module that receives reflected light and outputs a signal corresponding to light intensity of the reflected light; a calibration plate that outputs first reflected light to the sensor module, the first reflected light being used for comparing the light intensity of the reflected light; and a calibration unit that switches the input reflected light to the sensor module between the second reflected light reflected at a measured portion, and the first reflected light.
Public/Granted literature
- US20160238445A1 INFORMATION ACQUISITION APPARATUS AND INFORMATION ACQUISITION METHOD Public/Granted day:2016-08-18
Information query
