Invention Grant
- Patent Title: Normally-off high electron mobility transistors and fabrication methods thereof
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Application No.: US14953240Application Date: 2015-11-27
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Publication No.: US09786775B2Publication Date: 2017-10-10
- Inventor: Shang-Ju Tu
- Applicant: EPISTAR CORPORATION , HUGA OPTOTECH INC.
- Applicant Address: TW Hsinchu
- Assignee: EPISTAR CORPORATION
- Current Assignee: EPISTAR CORPORATION
- Current Assignee Address: TW Hsinchu
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L29/778 ; H01L29/06 ; H01L29/20

Abstract:
Disclosure includes a normally-off field-effect semiconductor device and the fabrication method thereof. An antigrowth portion is formed on a template. A first semiconductor layer and a second semiconductor layer on the template form two heterojunctions for creating two-dimensional electron gas regions, while a heterojunction-free area defined by the antigrowth portion separate the heterojunctions. A dielectric layer is on the second semiconductor layer and above the antigrowth portion. Two channel electrodes formed on the second semiconductor layer are electrically coupled to the two-dimensional electron gas regions respectively. A gate electrode on the dielectric layer and above the antigrowth portion is used for control of conduction between the channel electrodes.
Public/Granted literature
- US20170154987A1 NORMALLY-OFF HIGH ELECTRON MOBILITY TRANSISTORS AND FABRICATION METHODS THEREOF Public/Granted day:2017-06-01
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