Invention Grant
- Patent Title: Spectrometry system, spectroscopic module, and positional deviation detection method
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Application No.: US14580848Application Date: 2014-12-23
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Publication No.: US09797774B2Publication Date: 2017-10-24
- Inventor: Akira Sano , Takashi Nagate , Kazunori Sakurai , Nozomu Hirokubo
- Applicant: Seiko Epson Corporation
- Applicant Address: JP
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2013-270763 20131227
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G01J3/02 ; G01J3/45 ; G01J3/26 ; G01J3/32
Abstract:
A spectrometry system includes an imaging apparatus that includes an imaging element which captures an image, and a spectroscopic module that includes a wavelength variable interference filter and an attachment unit which holds the wavelength variable interference filter, is provided to be attachable to and detachable from the imaging apparatus, and can dispose the wavelength variable interference filter on an optical path of incident light to the imaging element during attachment to the imaging apparatus.
Public/Granted literature
- US20150185081A1 SPECTROMETRY SYSTEM, SPECTROSCOPIC MODULE, AND POSITIONAL DEVIATION DETECTION METHOD Public/Granted day:2015-07-02
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