Invention Grant
- Patent Title: Device for measuring temperature distribution
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Application No.: US13997547Application Date: 2011-12-01
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Publication No.: US09816868B2Publication Date: 2017-11-14
- Inventor: Ki Soo Chang , Hae Young Choi , Seon Young Ryu , Geon Hee Kim , Sun Cheol Yang
- Applicant: Ki Soo Chang , Hae Young Choi , Seon Young Ryu , Geon Hee Kim , Sun Cheol Yang
- Applicant Address: KR Daejeon
- Assignee: Korea Basic Science Institute
- Current Assignee: Korea Basic Science Institute
- Current Assignee Address: KR Daejeon
- Agency: Osha Liang LLP
- Priority: KR10-2010-0132630 20101222
- International Application: PCT/KR2011/009268 WO 20111201
- International Announcement: WO2012/086942 WO 20120628
- Main IPC: G01K3/00
- IPC: G01K3/00 ; G01K3/06 ; G01J5/00 ; G01J5/04 ; G01J5/08 ; G01K11/12

Abstract:
The present invention pertains to a device for measuring a temperature distribution, which can measure a temperature distribution without contacting a minor sample having a three-dimensional structure. More particularly, the device for measuring the temperature distribution can measure a three-dimensional temperature distribution for a sample, wherein the temperature distribution in a depth direction (direction z) of the sample is measured by a thermo-reflectance technique using a chromatic dispersion lens, a diffraction spectrometer and an optical detection array; and the temperature distribution in parallel directions (direction x-y axes) of the sample is measured by the thermo-reflectance technique using a biaxial scanning mirror.
Public/Granted literature
- US20130301676A1 DEVICE FOR MEASURING TEMPERATURE DISTRIBUTION Public/Granted day:2013-11-14
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