Invention Grant
- Patent Title: Identifying a defect in a data-storage medium
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Application No.: US14949328Application Date: 2015-11-23
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Publication No.: US09837119B2Publication Date: 2017-12-05
- Inventor: Shayan Srinivasa Garani , Sivagnanam Parthasarathy
- Applicant: STMICROELECTRONICS, INC.
- Applicant Address: US TX Carrollton
- Assignee: STMICROELECTRONICS, INC
- Current Assignee: STMICROELECTRONICS, INC
- Current Assignee Address: US TX Carrollton
- Agency: Slater Matsil, LLP
- Main IPC: G11B27/36
- IPC: G11B27/36 ; G11B20/18 ; G06F11/20 ; G11B20/10

Abstract:
An embodiment of a data-read path includes a defect detector and a data-recovery circuit. The defect detector is operable to identify a defective region of a data-storage medium, and the data-recovery circuit is operable to recover data from the data-storage medium in response to the defect detector. For example, such an embodiment may allow identifying a defective region of a data-storage disk caused, e.g., by a scratch or contamination, and may allow recovering data that was written to the defective region.
Public/Granted literature
- US20160077941A1 IDENTIFYING A DEFECT IN A DATA-STORAGE MEDIUM Public/Granted day:2016-03-17
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