Abstract:
An embodiment of a data-read path includes a defect detector and a data-recovery circuit. The defect detector is operable to identify a defective region of a data-storage medium, and the data-recovery circuit is operable to recover data from the data-storage medium in response to the defect detector. For example, such an embodiment may allow identifying a defective region of a data-storage disk caused, e.g., by a scratch or contamination, and may allow recovering data that was written to the defective region.
Abstract:
An interleave address generation circuit includes a plurality of linear feedback shift registers operable to generate addresses for permuting a data block in a first domain to a data block in a second domain on a subword basis. The interleave address generation circuit is operable to generate the lane addresses for each subword and the linear feedback registers configured to generate circulant addresses and sub-circulant address to map bits in each subword in the data block in the first domain to a corresponding subword in the second domain.