Invention Grant
- Patent Title: Measurement device
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Application No.: US14642854Application Date: 2015-03-10
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Publication No.: US09857208B2Publication Date: 2018-01-02
- Inventor: Mariko Yao , Masakazu Hori , Kazuhiro Shimizu
- Applicant: YOKOGAWA ELECTRIC CORPORATION
- Applicant Address: JP Tokyo
- Assignee: YOKOGAWA ELECTRIC CORPORATION
- Current Assignee: YOKOGAWA ELECTRIC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2014-051557 20140314
- Main IPC: G01D18/00
- IPC: G01D18/00 ; G01R31/00 ; H03M1/10

Abstract:
A measurement device according to one aspect of the present invention includes a first controller configured to output a control signal and a second controller configured to perform a first control and then to perform a second control based on the control signal output from the first controller. The control signal designates both an input signal and a calibration signal to be converted into a digital input signal and a digital calibration signal, respectively. The input signal is input from an outside of the measurement device. The calibration signal is previously prepared. The first control is for selecting the input signal and converting the selected input signal into the digital input signal. The second control is for selecting the calibration signal and converting the selected calibration signal into the digital calibration signal and for calculating a measured value using the digital input signal converted by the first control and another digital calibration signal converted by a control performed before the first control.
Public/Granted literature
- US20150260552A1 MEASUREMENT DEVICE Public/Granted day:2015-09-17
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