Invention Grant
- Patent Title: Charged particle beam apparatus and image forming method of charged particle beam apparatus
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Application No.: US15365545Application Date: 2016-11-30
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Publication No.: US09859094B2Publication Date: 2018-01-02
- Inventor: Wen Li , Kazuki Ikeda , Takuma Nishimoto , Hiroyuki Takahashi , Hajime Kawano
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Miles & Stockbridge P.C.
- Priority: JP2016-008593 20160120
- Main IPC: H01J37/22
- IPC: H01J37/22 ; H01J37/244 ; H01J37/28

Abstract:
In an image forming method of charged particle beam apparatus for scanning a sample by irradiating the sample with a converged charged particle beam and detecting secondary charged particles generated from the sample by a detection unit, receiving and processing an output signal from the detection unit, and receiving the processed signal and forming an image of the sample, receiving and processing the output signal are performed by analogically processing the output signal and by performing pulse-count processing on the output signal, and pulse-count processing is performed by removing a ringing pulse in the output signal and counting pulses in the signal from which the ringing pulse has been removed.
Public/Granted literature
- US20170207061A1 CHARGED PARTICLE BEAM APPARATUS AND IMAGE FORMING METHOD OF CHARGED PARTICLE BEAM APPARATUS Public/Granted day:2017-07-20
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