Invention Grant
- Patent Title: Semiconductor device and metering apparatus
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Application No.: US15365221Application Date: 2016-11-30
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Publication No.: US09881855B2Publication Date: 2018-01-30
- Inventor: Yosuke Iwasa
- Applicant: LAPIS Semiconductor Co., Ltd.
- Applicant Address: JP Yokohama
- Assignee: LAPIS Semiconductor Co., Ltd.
- Current Assignee: LAPIS Semiconductor Co., Ltd.
- Current Assignee Address: JP Yokohama
- Agency: Rabin & Berdo, P.C.
- Priority: JP2012-203060 20120914
- Main IPC: H03B5/04
- IPC: H03B5/04 ; H01L23/495 ; H03L1/02 ; H01L25/07

Abstract:
A semiconductor device includes: an oscillator; a semiconductor chip that includes an oscillation circuit connected to the oscillator, a timer circuit that generates a timing signal of a frequency according to a oscillation frequency of the oscillation circuit, and a frequency correction section that corrects a frequency of the timing signal based on temperature data; and a discrete device that includes at least one of a temperature sensing device that detects a peripheral temperature, that supplies the detected temperature as temperature data to the frequency correction section, and that is provided as a separate body to the semiconductor chip, or a capacitor that is electrically connected to both the oscillator and the oscillation circuit and that is provided as a separate body to the semiconductor chip, wherein the oscillator, the semiconductor chip and the discrete device are contained within a single package.
Public/Granted literature
- US20170084522A1 SEMICONDUCTOR DEVICE AND METERING APPARATUS Public/Granted day:2017-03-23
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