Invention Grant
- Patent Title: Thermal needle probe
-
Application No.: US14843990Application Date: 2015-09-02
-
Publication No.: US09891180B2Publication Date: 2018-02-13
- Inventor: Chien-Chih Yeh
- Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Applicant Address: TW Hsinchu
- Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Current Assignee Address: TW Hsinchu
- Agency: Rabin & Berdo, P.C.
- Main IPC: G01N25/18
- IPC: G01N25/18 ; G01K3/10

Abstract:
According to embodiments of the disclosure, a thermal needle probe is provided. The thermal needle probe may include a heater, a cooler, a temperature measuring element, a heat conduction element and a processor. The heater is configured to heat an object. The cooler is configured to cool the object. The temperature measuring element is configured to measure a temperature raising curve of the object and a temperature dropping curve of the object. The heat conduction element is configured to conduct heat between the heater and the object. The processor is configured to determine a thermal property of the object according to at least one of the temperature raising curve and the temperature dropping curve.
Public/Granted literature
- US20170059498A1 THERMAL NEEDLE PROBE Public/Granted day:2017-03-02
Information query