Invention Grant
- Patent Title: Mass spectrometry device
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Application No.: US15324092Application Date: 2015-06-15
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Publication No.: US09892901B2Publication Date: 2018-02-13
- Inventor: Hideki Hasegawa , Hiroyuki Satake , Masao Suga , Yuichiro Hashimoto
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Miles & Stockbridge P.C.
- Priority: JP2014-139292 20140707
- International Application: PCT/JP2015/067109 WO 20150615
- International Announcement: WO2016/006390 WO 20160114
- Main IPC: H01J49/24
- IPC: H01J49/24 ; H01J49/34 ; H01J49/16 ; H01J49/04

Abstract:
A mass spectrometry device that can perform highly robust, highly sensitive, and low-noise analysis and addresses the problems of preventing reductions in ion transfer efficiency and of suppressing the introduction of noise components from droplets, etc. An ion source generates ions, a vacuum chamber is evacuated by an evacuation means and for analyzing the mass of ions, and an ion introduction electrode introduces ions into the vacuum chamber. The ion introduction electrode has an ion-source-side front-stage pore, a vacuum-chamber-side rear-stage pore, and an intermediate pressure chamber between the front-stage pore and the rear-stage pore, the cross-sectional area of an ion inlet of the intermediate pressure chamber is larger than the cross-sectional area of the front-stage pore, the position of the central axis of the front-stage pore and the position of the central axis of the rear-stage pore are eccentric, and the cross-sectional area of an ion outlet of the intermediate pressure chamber is smaller than the cross-sectional area of the ion inlet.
Public/Granted literature
- US20170162375A1 MASS SPECTROMETRY DEVICE Public/Granted day:2017-06-08
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