Invention Grant
- Patent Title: Scanning microscope with polarised sample illumination
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Application No.: US14916538Application Date: 2014-09-03
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Publication No.: US09909976B2Publication Date: 2018-03-06
- Inventor: Vishnu Vardhan Krishnamachari
- Applicant: LEICA MICROSYSTEMS CMS GMBH
- Applicant Address: DE Wetzlar
- Assignee: Leica Microsystems CMS GmbH
- Current Assignee: Leica Microsystems CMS GmbH
- Current Assignee Address: DE Wetzlar
- Agency: Hodgson Russ LLP
- Priority: DE102013217499 20130903; DE102013227108 20131223
- International Application: PCT/EP2014/068751 WO 20140903
- International Announcement: WO2015/032823 WO 20150312
- Main IPC: G01J3/44
- IPC: G01J3/44 ; G01N21/21 ; G02B21/00 ; G02B27/28 ; G01N21/65

Abstract:
The invention relates to a method for investigating a sample, the sample being impinged upon by illuminating light, and detected light emerging from the sample being directed to a detector, and the illuminating light being directed through an acousto-optic component with which the impingement upon the sample by illuminating light can be temporarily interrupted. The method is notable for the fact that the sample is illuminated with a first illuminating light bundle that has a first linear polarization direction, and with a second illuminating light bundle whose linear polarization direction is continuously switched over between the first linear polarization direction and a second linear polarization direction different from the first linear polarization direction, the illuminating light having the first linear polarization direction proceeding along a first light path and illuminating light having the second linear polarization direction proceeding along a second light path, and the acousto-optic component combining the light paths.
Public/Granted literature
- US20160223457A1 SCANNING MICROSCOPE WITH POLARISED SAMPLE ILLUMINATION Public/Granted day:2016-08-04
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