Invention Grant
- Patent Title: Temperature probe and method for producing a temperature probe
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Application No.: US14442346Application Date: 2013-09-27
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Publication No.: US09958335B2Publication Date: 2018-05-01
- Inventor: Jan Ihle , Gerald Kloiber
- Applicant: EPCOS AG
- Applicant Address: DE Munich
- Assignee: EPCOS AG
- Current Assignee: EPCOS AG
- Current Assignee Address: DE Munich
- Agency: Slater Matsil, LLP
- Priority: DE102012110849 20121112
- International Application: PCT/EP2013/070245 WO 20130927
- International Announcement: WO2014/072123 WO 20140515
- Main IPC: G01K1/08
- IPC: G01K1/08 ; G01K7/22
Abstract:
The invention relates to a temperature probe comprising two first ceramic plates, a second ceramic plate arranged between the first ceramic plates, and two third ceramic plates. Each of the two first ceramic plates comprises an opening in each in which an NTC sensor element is arranged. An electrode is arranged between the second ceramic plate and each of the first ceramic plates. The first and the second ceramic plates are arranged between the two third ceramic plates. An electrode is arranged between each third ceramic plate and a first ceramic plate. Each electrode electrically contacts an NTC sensor element. Each NTC sensor element is enclosed by ceramic plates. The first, the second and the third ceramic plates and the NTC sensor elements are sintered to form a ceramic body. The invention further relates to a method for producing a temperature probe.
Public/Granted literature
- US20160299011A1 Temperature Probe and Method for Producing a Temperature Probe Public/Granted day:2016-10-13
Information query
