Invention Grant
- Patent Title: Temperature probe and method for producing a temperature probe
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Application No.: US14442365Application Date: 2013-09-27
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Publication No.: US09958336B2Publication Date: 2018-05-01
- Inventor: Jan Ihle , Gerald Kloiber
- Applicant: EPCOS AG
- Applicant Address: DE Munich
- Assignee: EPCOS AG
- Current Assignee: EPCOS AG
- Current Assignee Address: DE Munich
- Agency: Slater Matsil, LLP
- Priority: DE102012110845 20121112
- International Application: PCT/EP2013/070252 WO 20130927
- International Announcement: WO2014/072125 WO 20140515
- Main IPC: G01K1/08
- IPC: G01K1/08 ; G01K7/22 ; B28B1/24 ; C04B35/10 ; C04B35/64
Abstract:
The invention relates to a temperature probe which comprises a functional ceramic probe element and a ceramic housing. The probe element is mounted in the ceramic housing so that at a face of the probe element has direct and form-fitting contact with the ceramic housing. The invention further relates to a method for producing a temperature probe.
Public/Granted literature
- US20160265979A1 Temperature Probe and Method for Producing a Temperature Probe Public/Granted day:2016-09-15
Information query
