Invention Grant
- Patent Title: Cross-section processing and observation method and cross-section processing and observation apparatus
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Application No.: US14728004Application Date: 2015-06-02
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Publication No.: US09966226B2Publication Date: 2018-05-08
- Inventor: Atsushi Uemoto , Xin Man , Tatsuya Asahata
- Applicant: HITACHI HIGH-TECH SCIENCE CORPORATION
- Applicant Address: JP
- Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
- Current Assignee: HITACHI HIGH-TECH SCIENCE CORPORATION
- Current Assignee Address: JP
- Agent Bruce L. Adams
- Priority: JP2012-251589 20121115; JP2013-228112 20131101
- Main IPC: G01N23/225
- IPC: G01N23/225 ; H01J37/304 ; H01J37/26 ; H01J37/30 ; G01N23/22 ; G01N23/04 ; G01T1/36 ; H01J37/28 ; G01N1/32

Abstract:
A cross-section processing and observation method performed by a cross-section processing and observation apparatus comprises a cross-section processing step of forming a cross-section by irradiating a sample with an ion beam; a cross-section observation step of obtaining an observation image of the cross-section by irradiating the cross-section with an electron beam; and repeating the cross-section processing step and the cross-section observation step so as to obtain observation images of a plurality of cross-sections. In a case where Energy Dispersive X-ray Spectrometry (EDS) measurement of the cross-section is performed and an X-ray of a specified material or of a non-specified material that is different from a pre-specified material is detected, an irradiation condition of the ion beam is changed so as to obtain observation images of a plurality of cross-sections of the specified material, and the cross-section processing and observation of the specified material is performed.
Public/Granted literature
- US20150262788A1 CROSS-SECTION PROCESSING AND OBSERVATION METHOD AND CROSS-SECTION PROCESSING AND OBSERVATION APPARATUS Public/Granted day:2015-09-17
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