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公开(公告)号:US3474530A
公开(公告)日:1969-10-28
申请号:US3474530D
申请日:1967-02-03
Applicant: IBM
Inventor: AINSLIE NORMAN G , CHHABRA DEVENDRA S , JEPSEN DONALD W , MUTTER WALTER E
CPC classification number: H01L21/78 , H01B13/00 , H01L21/00 , H01L27/00 , Y10S438/927 , Y10T29/49004
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公开(公告)号:US2889535A
公开(公告)日:1959-06-02
申请号:US54159255
申请日:1955-10-20
Applicant: IBM
Inventor: NATHANIEL ROCHESTER , JOHNSON JACOB R , AMDAHL GENE M , MUTTER WALTER E
IPC: G06K9/46
CPC classification number: G06K9/4604 , G06K2209/01
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3.Combined transistor and testing structures and fabrication thereof 失效
Title translation: 组合晶体管及其测试结构及其制造公开(公告)号:US3465427A
公开(公告)日:1969-09-09
申请号:US64421267
申请日:1967-06-07
Applicant: IBM
Inventor: BARSON FRED , MUTTER WALTER E
IPC: G01R31/28 , H01L21/8222 , H01L23/544 , B01J17/00 , H01L7/00
CPC classification number: H01L22/34 , G01R31/2884 , H01L21/8222 , H01L2924/3011
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公开(公告)号:US3451866A
公开(公告)日:1969-06-24
申请号:US3451866D
申请日:1967-05-05
Applicant: IBM
Inventor: MUTTER WALTER E
CPC classification number: H01L23/291 , H01L21/00 , H01L24/05 , H01L29/00 , H01L2224/04042 , H01L2224/48463 , H01L2924/12036 , H01L2924/12043 , Y10S148/037 , Y10S148/043 , Y10S148/098 , Y10S148/151 , Y10S438/919 , Y10S438/965 , H01L2924/00
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公开(公告)号:US3548491A
公开(公告)日:1970-12-22
申请号:US3548491D
申请日:1968-11-14
Applicant: IBM
Inventor: AINSLIE NORMAN G , CHHABRA DEVENDRA S , JEPSEN DONALD W , MUTTER WALTER E
CPC classification number: H01L21/78 , H01B13/00 , H01L21/00 , H01L27/00 , Y10T29/49758
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6.
公开(公告)号:US3461357A
公开(公告)日:1969-08-12
申请号:US3461357D
申请日:1967-09-15
Applicant: IBM
Inventor: MUTTER WALTER E , TOTTA PAUL A
IPC: H01L21/00 , H01L23/485 , H01L23/522 , H01L3/12 , H01L5/06
CPC classification number: H01L24/10 , H01L21/00 , H01L23/485 , H01L23/522 , H01L24/13 , H01L2224/05147 , H01L2224/05155 , H01L2224/05171 , H01L2224/05644 , H01L2224/13 , H01L2224/13099 , H01L2924/01013 , H01L2924/01015 , H01L2924/01024 , H01L2924/01027 , H01L2924/01029 , H01L2924/01033 , H01L2924/01042 , H01L2924/01046 , H01L2924/01047 , H01L2924/01072 , H01L2924/01074 , H01L2924/01077 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/01322 , H01L2924/01327 , H01L2924/014 , H01L2924/14 , H01L2924/00 , H01L2924/00014
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公开(公告)号:US3399331A
公开(公告)日:1968-08-27
申请号:US42103564
申请日:1964-12-24
Applicant: IBM
Inventor: MUTTER WALTER E , PURCELL EDWARD D
IPC: C22C32/00 , C23C14/14 , H01B1/00 , H01L21/00 , H01L23/485
CPC classification number: H01L21/00 , C22C32/00 , C22C32/0052 , C23C14/14 , H01B1/00 , H01L23/485 , H01L2924/0002 , H01L2924/00
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8.Semiconductor devices and methods of applying metal films thereto 失效
Title translation: 半导体器件及其金属膜的施加方法公开(公告)号:US3067071A
公开(公告)日:1962-12-04
申请号:US15460
申请日:1960-01-04
Applicant: IBM
Inventor: MUTTER WALTER E
CPC classification number: H01L21/00 , H01L23/291 , H01L2924/0002 , Y10T428/12528 , H01L2924/00
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公开(公告)号:US3558352A
公开(公告)日:1971-01-26
申请号:US3558352D
申请日:1966-10-27
Applicant: IBM
Inventor: CASTRUCCI PAUL P , WITT DAVID DE , MUTTER WALTER E , DHAKA VIR A
IPC: H01L21/00 , H01L21/331 , H01L23/485 , H01L29/00 , H01L1/14 , H01L5/02
CPC classification number: H01L23/485 , H01L21/00 , H01L29/00 , H01L29/66303 , H01L2924/0002 , Y10S438/951 , H01L2924/00
Abstract: A SEMICONDUCTIVE DEVICE AND A METHOD FOR FORMING A SEMICONDUCTOR DEVICE WHEREIN THE OHMIC CONTACT IS IN THE ORDER OF MICRONS IN WIDTH. A FIRST METAL IS FORMED IN THE OPENING IN THE PROTECTIVE COATING WHICH ACTS AS THE OHMIC CONTACT TO THE SEMICONDUCTOR DEVICE. A SECOND METAL MAY BE APPLIED ONLY OVER THE FIRST METAL BY ELECTROLESS OR ELECTROPLATING TECHNIQUES TO INCREASE THE CONDUCTIVITY OF THE OHMIC CONTACT. FINALLY, AN EXTERNAL LAND METAL LAYER IS DEPOSITED OVER A RELATIVELY LARGE AREA OF THE PROTECTIVE COATING IN THE AREA OF THE OHMIC CONTACT WITH FINGER-LIKE EXTENSIONS OF THE LAND METAL LAYER CONTACTING THE OHMIC CONTACT BY SHORT OVERLAID AREAS. THE EXTERNAL LAND IS THE ONLY METAL LAYER IN THE PROCESS FORMED WHICH REQUIRES A PHOTOGRAPHIC MASK. THE PROCESS, THEREFORE, IN NOT LIMITED BY PRESENT DAY PHOTOENGRAVING TECHNIQUES.
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10.Combined transistor and testing structures and fabrication thereof 失效
Title translation: 组合晶体管和测试结构及其制造公开(公告)号:US3335340A
公开(公告)日:1967-08-08
申请号:US34683464
申请日:1964-02-24
Applicant: IBM
Inventor: FRED BARSON , MUTTER WALTER E
IPC: G01R31/28 , H01L21/8222 , H01L23/544
CPC classification number: H01L22/34 , G01R31/2884 , H01L21/8222 , H01L2924/3011
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