1.
    发明专利
    未知

    公开(公告)号:DE69417772D1

    公开(公告)日:1999-05-12

    申请号:DE69417772

    申请日:1994-08-27

    Applicant: IBM

    Abstract: PCT No. PCT/EP94/02844 Sec. 371 Date Feb. 26, 1997 Sec. 102(e) Date Feb. 26, 1997 PCT Filed Aug. 27, 1994 PCT Pub. No. WO96/07074 PCT Pub. Date Mar. 7, 1996A fine-positioning apparatus for a scanning probe microscope includes magnetic solenoid actuators for each of the x, y and z scanning axes of the microscope. The sample is mounted on the coil of one of the actuators for movement of the sample in the z direction while the tunnelling probe is attached to two other solenoid actuators for movement of the probe in the x and y directions.

    2.
    发明专利
    未知

    公开(公告)号:DE69417772T2

    公开(公告)日:1999-12-02

    申请号:DE69417772

    申请日:1994-08-27

    Applicant: IBM

    Abstract: PCT No. PCT/EP94/02844 Sec. 371 Date Feb. 26, 1997 Sec. 102(e) Date Feb. 26, 1997 PCT Filed Aug. 27, 1994 PCT Pub. No. WO96/07074 PCT Pub. Date Mar. 7, 1996A fine-positioning apparatus for a scanning probe microscope includes magnetic solenoid actuators for each of the x, y and z scanning axes of the microscope. The sample is mounted on the coil of one of the actuators for movement of the sample in the z direction while the tunnelling probe is attached to two other solenoid actuators for movement of the probe in the x and y directions.

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