DATA OVERWRITING IN PROBE BASE DATA STORAGE DEVICE

    公开(公告)号:JP2004005969A

    公开(公告)日:2004-01-08

    申请号:JP2003133291

    申请日:2003-05-12

    Applicant: IBM

    Abstract: PROBLEM TO BE SOLVED: To provide a method for overwriting data in a probe base data storage device wherein the data are represented by the existence/absence of a pit formed on a storage surface by a device probe. SOLUTION: Input data are encoded such that continuous bits of first values in coded input data are divided by at least one bit of another value. Overwritten data bits v 0 , v 1 , ... are generated from the coded input data b 0 , b 1 , ... used to overwrite data on the storage surface 4. The overwritten data bits are formula 1 with respect to i ≥1 when a pit represents the first value in the data storage device, and are generated such that v 0 has the first value. The overwritten data bits are v 1 = b i-1 with respect to i ≥1 and are generated such that v 0 has another value. COPYRIGHT: (C)2004,JPO

    HEAD SUSPENSION FOR DATA STORAGE DEVICE OF DISK BASE

    公开(公告)号:JP2002109845A

    公开(公告)日:2002-04-12

    申请号:JP2001227020

    申请日:2001-07-27

    Applicant: IBM

    Abstract: PROBLEM TO BE SOLVED: To provide a very sensitive sensor system which measures a gap between a disk and a head at relatively high speed. SOLUTION: The head suspension maintaing the gap between a reading and writing head and a data storage disk, is provided with a heater which heats up gas in the gap and sensors 90 to 140 which generate outputs indicating the thickness of the gap. The sensor 90 generates an output in accordance with heat conduction crossing the gap.

    4.
    发明专利
    未知

    公开(公告)号:DE69417772D1

    公开(公告)日:1999-05-12

    申请号:DE69417772

    申请日:1994-08-27

    Applicant: IBM

    Abstract: PCT No. PCT/EP94/02844 Sec. 371 Date Feb. 26, 1997 Sec. 102(e) Date Feb. 26, 1997 PCT Filed Aug. 27, 1994 PCT Pub. No. WO96/07074 PCT Pub. Date Mar. 7, 1996A fine-positioning apparatus for a scanning probe microscope includes magnetic solenoid actuators for each of the x, y and z scanning axes of the microscope. The sample is mounted on the coil of one of the actuators for movement of the sample in the z direction while the tunnelling probe is attached to two other solenoid actuators for movement of the probe in the x and y directions.

    8.
    发明专利
    未知

    公开(公告)号:DE69417772T2

    公开(公告)日:1999-12-02

    申请号:DE69417772

    申请日:1994-08-27

    Applicant: IBM

    Abstract: PCT No. PCT/EP94/02844 Sec. 371 Date Feb. 26, 1997 Sec. 102(e) Date Feb. 26, 1997 PCT Filed Aug. 27, 1994 PCT Pub. No. WO96/07074 PCT Pub. Date Mar. 7, 1996A fine-positioning apparatus for a scanning probe microscope includes magnetic solenoid actuators for each of the x, y and z scanning axes of the microscope. The sample is mounted on the coil of one of the actuators for movement of the sample in the z direction while the tunnelling probe is attached to two other solenoid actuators for movement of the probe in the x and y directions.

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