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公开(公告)号：JP2008217013A
公开(公告)日：2008-09-18
申请号：JP2008053442
申请日：2008-03-04
Inventor： BIRK HOLGER , DYBA MARCUS , GUGEL HILMAR , VOLKER SEYFRIED
IPC: G02B21/06
CPC classification number: G02B21/06
Abstract: PROBLEM TO BE SOLVED: To provide a device and method for adjusting a beam in an optical beam path.
SOLUTION: The device for beam adjustment in optical beam paths having at least two mutually independent light sources (1 and 2), preferably, in beam paths (8 and 9) of a high resolution or super high resolution microscope requires superposition of beams of light sources (1 and 2) in a common illuminating beam path (10), and a calibration sample (22) assisting in checking pupil positions and/or focus positions of the beams is put in the illuminating beam path (10) and can be taken out of it.
COPYRIGHT: (C)2008,JPO&INPITAbstract translation: 要解决的问题：提供一种用于调整光束路径中的光束的装置和方法。 解决方案：用于具有至少两个相互独立的光源（1和2）的光束路径中的光束调节装置优选地在高分辨率或超高分辨率显微镜的光束路径（8和9）中需要叠加 在公共照明光路（10）中的光源（1和2）光束和辅助检查光束的光瞳位置和/或聚焦位置的校准样品（22）被放入照明光束路径（10）和 可以从中取出。 版权所有（C）2008，JPO＆INPIT
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公开(公告)号：JP2014098920A
公开(公告)日：2014-05-29
申请号：JP2013273064
申请日：2013-12-27
Inventor： BIRK HOLGER , DYBA MARCUS , GUGEL HILMAR , VOLKER SEYFRIED
CPC classification number: G02B21/06
Abstract: PROBLEM TO BE SOLVED: To provide a device and method for adjusting a beam in an optical beam path.SOLUTION: A device for beam adjustment in optical beam paths having at least two mutually independent light sources (1 and 2), preferably, in beam paths (8 and 9) of a high resolution or super high resolution microscope requires superposition of beams of the light sources (1 and 2) in a common illuminating beam path (10). In the device, a calibration sample (22) for assisting so as to check pupil positions and/or focus positions of the beams is put in the illuminating beam path (10) and can be taken out from the illuminating beam path (10).
Abstract translation: 要解决的问题：提供一种用于调整光束路径中的光束的装置和方法。解决方案：一种用于光束路径中的光束调节的装置，其具有至少两个相互独立的光源（1和2），优选地在光束 高分辨率或超高分辨率显微镜的路径（8和9）需要在公共照明光束路径（10）中叠加光源（1和2）的光束。 在该装置中，将用于辅助以检查光束的瞳孔位置和/或聚焦位置的校准样本（22）放入照明光束路径（10）中并且可以从照明光路（10）中取出。
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3.发明专利
公开(公告)号：JP2007233370A
公开(公告)日：2007-09-13
申请号：JP2007019423
申请日：2007-01-30
Inventor： GUGEL HILMAR , DYBA MARCUS
CPC classification number: G01N21/6458 , G01N2021/6432
Abstract: PROBLEM TO BE SOLVED: To provide a method and a laser scanning type fluorescence microscope by which a sample is inexpensively and rapidly scanned with compact and simple structure.
SOLUTION: The sample (1) to be examined comprises a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, the method comprises the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in the form of a focal line (10) with a cross-sectional profile having at least one intensity zero point (5) with laterally neighboring intensity maxima (9).
COPYRIGHT: (C)2007,JPO&INPITAbstract translation: 要解决的问题：提供一种方法和激光扫描型荧光显微镜，通过该方法和激光扫描型荧光显微镜，以小型且简单的结构便宜且快速地扫描样品。 检查样品（1）包括能够从第一状态（Z1，A）重复转换为第二状态（Z2，B）的物质，第一状态和第二状态（Z1，A） ; Z2，B）在至少一个光学性质上彼此不同，所述方法包括以下步骤：待记录的样品区域（P）中的物质首先进入第一状态（Z1，A），并且 通过光信号（4）感应第二状态（Z2，B），在被记录的采样区域（P）内被特别排除的空间划分的子区域被定义为光信号（4）设置在 具有截面轮廓的焦线（10）的形式具有至少一个具有横向相邻的强度最大值（9）的强度零点（5）。 版权所有（C）2007，JPO＆INPIT
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公开(公告)号：JP2007232713A
公开(公告)日：2007-09-13
申请号：JP2007018721
申请日：2007-01-30
Inventor： GUGEL HILMAR , DYBA MARCUS , SEYFRIED VOLKER
CPC classification number: G01N21/6458
Abstract: PROBLEM TO BE SOLVED: To provide a high spatial resolution inspection method using a laser scanning fluorescence microscope.
SOLUTION: A sample 1 contains a substance transited repeatedly from the first state (Z1, A) to the second state (Z2, B), and the first state is different in at least one optical property from the second state. The method includes steps of: (a) transiting the substance to the first state by a switch signal 2 within a recorded sample area P; (b) inducing the second state by an optical signal 4, and for removing clearly a spatially limited partial area within the recorded sample area P; (c) reading the residual first area (Z1, A1, A2, A3) by a test signal 7; and (d) repeating the steps (a)-(c), and displacing the optical signal 4 in every repetition to scan the sample 1. The steps (a)-(d) are carried out in a sequence adapted to individual measuring situations, in the method.
COPYRIGHT: (C)2007,JPO&INPITAbstract translation: 要解决的问题：提供使用激光扫描荧光显微镜的高空间分辨率检查方法。 解决方案：样品1包含从第一状态（Z1，A）到第二状态（Z2，B）反复转移的物质，并且第一状态在至少一种光学性质与第二状态不同。 该方法包括以下步骤：（a）通过记录样本区域P内的开关信号2将物质转移到第一状态; （b）通过光信号4引起第二状态，并清除记录样本区域P内的空间有限的部分区域; （c）通过测试信号7读取残留第一区域（Z1，A1，A2，A3）; 并且（d）重复步骤（a） - （c），并且在每次重复中移位光学信号4以扫描样品1.步骤（a） - （d）以适合各个测量情况的顺序进行 ，在该方法中。 版权所有（C）2007，JPO＆INPIT
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公开(公告)号：DE102011053232A1
公开(公告)日：2013-03-07
申请号：DE102011053232
申请日：2011-09-02
Applicant: LEICA MICROSYSTEMS
Inventor： DYBA MARCUS
IPC: G02B21/18
Abstract: Beschrieben ist eine mikroskopische Einrichtung (10) zur dreidimensionalen Lokalisierung von punktförmigen Objekten (14, 16). Die Einrichtung (10) umfasst zwei Abbildungsoptiken (12, 26, 26‘), die ein und dasselbe in einem Objektraum (18) angeordnete punktförmige Objekt (14, 16) jeweils in Form einer Fokuslichtverteilung (40, 40’, 42, 42’) in zwei separate Bildräume (34) abbilden, zwei Detektoreinheiten (28, 28’), die jeweils einer der beiden Abbildungsoptiken (12, 26, 26‘) zugeordnet sind und in Detektionspunkten einer in dem jeweiligen Bildraum (34) liegenden Detektionsfläche (27, 27‘) einen auswertbaren Lichtfleck (54, 54’) erfassen und eine Auswerteeinheit (60), welche die Detektionspunkte der beiden Detektionsflächen (27, 27‘) paarweise in Korrespondenz zueinander setzt und durch Auswerten der beiden Lichtflecke (54, 54‘) eine laterale x-y-Position und eine axiale z-Position des punktförmigen Objektes (14, 16) ermittelt. Die beiden Abbildungsoptiken (12, 26, 26‘) weisen jeweils ein optisches Mittel (26, 26‘) auf, das die jeweilige Fokuslichtverteilung (40, 40’, 42, 42’) schräg zu einer in der jeweiligen Abbildungsoptik (12, 26, 26‘) vorgesehenen Detektionsachse (36) ausrichtet, die senkrecht zur Detektionsfläche (27, 27‘) der jeweiligen Detektionseinheit (26, 26‘) liegt. Die durch die optischen Mittel (26, 26‘) bewirkten Schrägstellungen der beiden Fokuslichtverteilungen (40, 40’, 42, 42’) sind einander derart entgegengesetzt, dass sich die beiden Lichtflecke (54, 54‘) mit einer Änderung der z-Position des punktförmigen Objektes (14, 16) in ihren jeweiligen Detektionsflächen (27, 27‘) unter Berücksichtigung der Detektionspunktkorrespondenz gegenläufig verschieben. Die Auswerteeinheit (60) ermittelt die axiale z-Position des punktförmigen Objektes (14, 16) an Hand der relativen Lage der beiden Lichtflecke (54, 54‘).
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Patent Agency Ranking
公开(公告)号：DE102006009833A1
公开(公告)日：2007-09-06
申请号：DE102006009833
申请日：2006-03-01
Applicant: LEICA MICROSYSTEMS
Inventor： DYBA MARCUS , GUGEL HILMAR
Abstract: The process involves bringing a substance of a sample in a sample region to be detected in a condition. Another condition is induced by optical signals, and spatial limited partial regions within the sample region to be detected are omitted in a selective manner. The optical signal is provided such that a vertical wave (9) with defined intensity-zero is formed in the sample region to be detected, where the vertical wave is generated by focusing coherent light rays (10,11) in a pupil of an objective (13). The coherent light rays are provided by using glass fibers. An independent claim is also included for a microscope, in particular laser-raster-fluorescence microscope for spatial high resolution examination of samples.
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公开(公告)号：DE102006056429B3
公开(公告)日：2008-02-14
申请号：DE102006056429
申请日：2006-11-28
Applicant: LEICA MICROSYSTEMS
Inventor： DYBA MARCUS
IPC: G02B21/00
Abstract: An imaging device (110) has at least one light-source (114,116) for generating at least one coherent illumination light (124) for illuminating at least one zone within or on the test sample. A spatially separating beam-splitter (140) at least partly separates coherent detection-light emitted from incoherent detection light outputted from the test sample (112). At least one additional beam splitting element (160) is arranged in the beam path for separating the coherent detection light (146) from the coherent illumination light (124). Independent claims are given for the following. (1) (A) A method for imaging at least one microscopic property of a test sample (2) (B) Application of a device for coherent laser spectroscopy method.
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公开(公告)号：LU92924B1
公开(公告)日：2017-08-07
申请号：LU92924
申请日：2015-12-23
Applicant: LEICA MICROSYSTEMS
Inventor： DYBA MARCUS
Abstract: Eine Abtastvorrichtung (10) zum Abtasten eines Objekts (122) für den Einsatz in einem Rastermikroskop (100) umfasst mindestens eine Abtasteinheit (12) zum zweidimensionalen Abtasten des Objekts (122) mit Hilfe eines Lichtstrahls (104) und mindestens eine Rotationsvorrichtung (14) zum Drehen der Abtasteinheit (12) um eine Rotationsachse (16), um eine Bildfeldrotation zu erzeugen. Dabei umfasst die Abtasteinheit (12) mindestens ein Ablenkelement (18) zum Ablenken eines auf das Ablenkelement (18) auftreffenden Lichtstrahls (110). Ferner hat das Ablenkelement (18) eine rotationssymmetrische Form. (Figur 1a) 92924
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9.发明专利
公开(公告)号：LU92665A1
公开(公告)日：2016-08-25
申请号：LU92665
申请日：2015-02-24
Applicant: LEICA MICROSYSTEMS
Inventor： DYBA MARCUS
CPC classification number: G01J1/44 , G01J1/42 , G01J3/0297 , G01J3/2803 , G01J2001/4406 , G01J2001/442 , G01J2001/444 , G01J2001/4466 , G02B21/008 , H01L31/107
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公开(公告)号：DE102006062823B4
公开(公告)日：2010-11-25
申请号：DE102006062823
申请日：2006-03-01
Applicant: LEICA MICROSYSTEMS
Inventor： DYBA MARCUS , GUGEL HILMAR
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