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公开(公告)号：JP2002107634A
公开(公告)日：2002-04-10
申请号：JP2001278235
申请日：2001-09-13
Applicant: LEICA MICROSYSTEMS
Inventor： BEWERSDORF JOERG , GUGEL HILMAR , HOFMANN JUERGEN
Abstract: PROBLEM TO BE SOLVED: To provide an optical device capable of combining at least the greater part of light emitted from an object to be detected by a detecting optical path combining member without losing the light and guiding the combined light to a propagation direction. SOLUTION: In a detection object illuminating optical device including the illuminating optical path of a light source, the detecting optical path of a detector (5) and a member for combining the detecting optical path and prepared especially for a confocal or double confocal scanning microscope, light emitted from an object (1) to be detected can be combined by a member (detecting optical path combining member) (6) for combining the detecting optical path (4) as to the cross-section of a beam effective for the detector (5), at least the greater part of the combined light is superposed and transmitted in the propagation direction (19) and a member (phase adjusting member) for exerting influence upon the phase of light emitted from the object (1) is arranged at least in the divided optical path (12) of the detecting optical path (4).
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公开(公告)号：JP2002214536A
公开(公告)日：2002-07-31
申请号：JP2002000499
申请日：2002-01-07
Applicant: LEICA MICROSYSTEMS
Inventor： BEWERSDORF JOERG , GUGEL HILMAR
Abstract: PROBLEM TO BE SOLVED: To provide a microscope provided with auxiliary means which detect a change occurring in a drift, can be equilibrated and can easily and surely focus an object and a method of driving microscope. SOLUTION: This microscope is provided with at least one object supporting unit assigned to the object and is provided with at least one reference object having the known shape constitution thereof. The reference object is constituted to be detectable in the manner of optical microscope for the purpose of calibration, regulation and/or regulation operation of a raster microscope.
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公开(公告)号：JP2008217013A
公开(公告)日：2008-09-18
申请号：JP2008053442
申请日：2008-03-04
Inventor： BIRK HOLGER , DYBA MARCUS , GUGEL HILMAR , VOLKER SEYFRIED
IPC: G02B21/06
CPC classification number: G02B21/06
Abstract: PROBLEM TO BE SOLVED: To provide a device and method for adjusting a beam in an optical beam path.
SOLUTION: The device for beam adjustment in optical beam paths having at least two mutually independent light sources (1 and 2), preferably, in beam paths (8 and 9) of a high resolution or super high resolution microscope requires superposition of beams of light sources (1 and 2) in a common illuminating beam path (10), and a calibration sample (22) assisting in checking pupil positions and/or focus positions of the beams is put in the illuminating beam path (10) and can be taken out of it.
COPYRIGHT: (C)2008,JPO&INPITAbstract translation: 要解决的问题：提供一种用于调整光束路径中的光束的装置和方法。 解决方案：用于具有至少两个相互独立的光源（1和2）的光束路径中的光束调节装置优选地在高分辨率或超高分辨率显微镜的光束路径（8和9）中需要叠加 在公共照明光路（10）中的光源（1和2）光束和辅助检查光束的光瞳位置和/或聚焦位置的校准样品（22）被放入照明光束路径（10）和 可以从中取出。 版权所有（C）2008，JPO＆INPIT
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4.发明专利
公开(公告)号：JP2007233370A
公开(公告)日：2007-09-13
申请号：JP2007019423
申请日：2007-01-30
Inventor： GUGEL HILMAR , DYBA MARCUS
CPC classification number: G01N21/6458 , G01N2021/6432
Abstract: PROBLEM TO BE SOLVED: To provide a method and a laser scanning type fluorescence microscope by which a sample is inexpensively and rapidly scanned with compact and simple structure.
SOLUTION: The sample (1) to be examined comprises a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, the method comprises the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in the form of a focal line (10) with a cross-sectional profile having at least one intensity zero point (5) with laterally neighboring intensity maxima (9).
COPYRIGHT: (C)2007,JPO&INPITAbstract translation: 要解决的问题：提供一种方法和激光扫描型荧光显微镜，通过该方法和激光扫描型荧光显微镜，以小型且简单的结构便宜且快速地扫描样品。 检查样品（1）包括能够从第一状态（Z1，A）重复转换为第二状态（Z2，B）的物质，第一状态和第二状态（Z1，A） ; Z2，B）在至少一个光学性质上彼此不同，所述方法包括以下步骤：待记录的样品区域（P）中的物质首先进入第一状态（Z1，A），并且 通过光信号（4）感应第二状态（Z2，B），在被记录的采样区域（P）内被特别排除的空间划分的子区域被定义为光信号（4）设置在 具有截面轮廓的焦线（10）的形式具有至少一个具有横向相邻的强度最大值（9）的强度零点（5）。 版权所有（C）2007，JPO＆INPIT
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公开(公告)号：JP2007232713A
公开(公告)日：2007-09-13
申请号：JP2007018721
申请日：2007-01-30
Inventor： GUGEL HILMAR , DYBA MARCUS , SEYFRIED VOLKER
CPC classification number: G01N21/6458
Abstract: PROBLEM TO BE SOLVED: To provide a high spatial resolution inspection method using a laser scanning fluorescence microscope.
SOLUTION: A sample 1 contains a substance transited repeatedly from the first state (Z1, A) to the second state (Z2, B), and the first state is different in at least one optical property from the second state. The method includes steps of: (a) transiting the substance to the first state by a switch signal 2 within a recorded sample area P; (b) inducing the second state by an optical signal 4, and for removing clearly a spatially limited partial area within the recorded sample area P; (c) reading the residual first area (Z1, A1, A2, A3) by a test signal 7; and (d) repeating the steps (a)-(c), and displacing the optical signal 4 in every repetition to scan the sample 1. The steps (a)-(d) are carried out in a sequence adapted to individual measuring situations, in the method.
COPYRIGHT: (C)2007,JPO&INPITAbstract translation: 要解决的问题：提供使用激光扫描荧光显微镜的高空间分辨率检查方法。 解决方案：样品1包含从第一状态（Z1，A）到第二状态（Z2，B）反复转移的物质，并且第一状态在至少一种光学性质与第二状态不同。 该方法包括以下步骤：（a）通过记录样本区域P内的开关信号2将物质转移到第一状态; （b）通过光信号4引起第二状态，并清除记录样本区域P内的空间有限的部分区域; （c）通过测试信号7读取残留第一区域（Z1，A1，A2，A3）; 并且（d）重复步骤（a） - （c），并且在每次重复中移位光学信号4以扫描样品1.步骤（a） - （d）以适合各个测量情况的顺序进行 ，在该方法中。 版权所有（C）2007，JPO＆INPIT
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Patent Agency Ranking
公开(公告)号：JP2002303798A
公开(公告)日：2002-10-18
申请号：JP2002036734
申请日：2002-02-14
Applicant: LEICA MICROSYSTEMS
Inventor： GUGEL HILMAR , BEWERSDORF JOERG , HELL STEFAN W
Abstract: PROBLEM TO BE SOLVED: To fundamentally evade the problems of a reconstitution method. SOLUTION: The double confocal scanning microscope having an illumination beam path (1) of a light source (2) and a detecting beam path (3) of a detector (4) is provided with at least one optical constitution members (24 and 25) acting on the illumination beam path and/or the detecting beam path (1, 2). The optical constitution members are so constituted as to affect the amplitude and/or phase of light and/or polarized light. The microscope is thereby so constituted that the characteristics of the light are changed in the double confocal illumination beam path (1) and/or the detecting beam path (3).
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公开(公告)号：JP2001356274A
公开(公告)日：2001-12-26
申请号：JP2001105913
申请日：2001-04-04
Applicant: LEICA MICROSYSTEMS
Inventor： ENGELHARDT JOHANN , BEWERSDORF JOERG , GUGEL HILMAR , HOFFMANN JUERGEN
Abstract: PROBLEM TO BE SOLVED: To provide a double confocal scanning type microscope which can realize at least almost theoretically realizable resolution especially in association with polychromatic fluorescent use. SOLUTION: This invention relates to the double confocal scanning type microscope having an irradiation beam passage 2 of at least one light source 3 and a detection beam passage 4 of at least one detector 5. In particular, optical characteristics of elements 6, 10, 13 and 14 arranged at the beam passages are mutually adjusted so that accumulated aberration is at least as large as theoretically realizable resolution as to an optical axis 33 and/or at least one surfaces 18, 19 and 20 of a sample region.
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8.发明专利
公开(公告)号：JP2014122917A
公开(公告)日：2014-07-03
申请号：JP2014037013
申请日：2014-02-27
Inventor： GUGEL HILMAR
IPC: G01N21/64
CPC classification number: G02B21/002 , G01N21/636 , G01N21/6428 , G01N21/6458 , G01N2021/6419 , G01N2021/6421 , G02B21/16
Abstract: PROBLEM TO BE SOLVED: To provide a method for highly resolved optical scanning of a sample, which uses a laser scanning fluorescence microscope.SOLUTION: In the method, a sample 10 comprises a substance which can be shifted to different energy states (a first state Z1 and a second state Z2), and the sample is illuminated with light at a wavelength of an excitation spectrum of the substance for locally producing the first state Z1 of the substance and is illuminated with light at a suitable deexcitation wavelength in a focus edge region of the excitation for producing the second state Z2 of the substance, and emission light emanating from the sample and resulting from a decay of the remaining first state Z1 is detected by a detection device 89. The sample comprises at least one further substance which can be converted to a first state Z1' and a second state Z2', and respective substances differ from each other in at least one characteristic and at least partially match each other in at least one other characteristic, and the steps of the excitation and/or the deexcitation and/or the detection are carried out separately from one another in terms of time for the individual substances during scanning of the sample.
Abstract translation: 要解决的问题：提供使用激光扫描荧光显微镜的样品的高分辨率光学扫描的方法。解决方案：在该方法中，样品10包括可以转移到不同能量状态的物质（第一状态 Z1和第二状态Z2），并且用于物质的第一状态Z1的物质的激发光谱的波长的光照射样品，并且在聚焦边缘区域以适当的消除激发波长的光照射 用于产生物质的第二状态Z2的激发，以及从样品发出并由残留的第一状态Z1的衰减产生的发射光由检测装置89检测。样品包含至少一种其它物质，其可以是 转换成第一状态Z1'和第二状态Z2'，并且各个物质在至少一个特性中彼此不同，并且在至少一个特性中至少部分地彼此匹配 至少一个其它特征，并且激发和/或去激励和/或检测的步骤在扫描样品期间各个物质的时间方面彼此分开地进行。
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公开(公告)号：JP2014098920A
公开(公告)日：2014-05-29
申请号：JP2013273064
申请日：2013-12-27
Inventor： BIRK HOLGER , DYBA MARCUS , GUGEL HILMAR , VOLKER SEYFRIED
CPC classification number: G02B21/06
Abstract: PROBLEM TO BE SOLVED: To provide a device and method for adjusting a beam in an optical beam path.SOLUTION: A device for beam adjustment in optical beam paths having at least two mutually independent light sources (1 and 2), preferably, in beam paths (8 and 9) of a high resolution or super high resolution microscope requires superposition of beams of the light sources (1 and 2) in a common illuminating beam path (10). In the device, a calibration sample (22) for assisting so as to check pupil positions and/or focus positions of the beams is put in the illuminating beam path (10) and can be taken out from the illuminating beam path (10).
Abstract translation: 要解决的问题：提供一种用于调整光束路径中的光束的装置和方法。解决方案：一种用于光束路径中的光束调节的装置，其具有至少两个相互独立的光源（1和2），优选地在光束 高分辨率或超高分辨率显微镜的路径（8和9）需要在公共照明光束路径（10）中叠加光源（1和2）的光束。 在该装置中，将用于辅助以检查光束的瞳孔位置和/或聚焦位置的校准样本（22）放入照明光束路径（10）中并且可以从照明光路（10）中取出。
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10.发明专利
公开(公告)号：JP2012177919A
公开(公告)日：2012-09-13
申请号：JP2012028232
申请日：2012-02-13
Inventor： FLORIAN VALKEN , GUGEL HILMAR
CPC classification number: G02B21/0032 , G01J3/0205 , G01J3/0218 , G01J3/10 , G01J3/4406 , G01N21/6408 , G01N21/6458 , G02B21/0076 , G02B2207/114
Abstract: PROBLEM TO BE SOLVED: To provide a pulse combiner for various spectral colors of a supercontinuum laser pulse.SOLUTION: An illumination device (20) for a microscope (40) has a laser unit (24) that generates at least one broadband laser light pulse (30), and light components (71, 72, 73, 74, 75, 76) of different wavelengths of the broadband laser light pulse (30) are temporally offset from one another. A compensation unit (36) disposed in the path of the broadband laser light pulse (30) temporally offsets the light components (71, 72, 73, 74, 75, 76) of the broadband laser light pulse (30) in such a way that the light components (71, 72, 73, 74, 75, 76) exit the compensation unit (36) simultaneously or nearly simultaneously.
Abstract translation: 要解决的问题：提供用于超连续谱激光脉冲的各种光谱颜色的脉冲组合器。 解决方案：用于显微镜（40）的照明装置（20）具有产生至少一个宽带激光脉冲（30）的激光单元（24）和光分量（71,72,73,74,75 ，76）不同波长的宽带激光脉冲（30）在时间上彼此偏移。 布置在宽带激光脉冲（30）的路径中的补偿单元（36）以这种方式暂时偏移宽带激光脉冲（30）的光分量（71,72,73,74,75,76） 光部件（71,72,73,74,75,76）同时或几乎同时离开补偿单元（36）。 版权所有（C）2012，JPO＆INPIT
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