公开(公告)号：US09846081B2

公开(公告)日：2017-12-19

申请号：US14775321

申请日：2014-03-10

Applicant: OSAKA UNIVERSITY

Inventor： Tsuyoshi Konishi ,  Takema Satoh ,  Tomotaka Nagashima

IPC: G01J3/28 ,  G01J3/457 ,  G01J3/18 ,  G01J3/02 ,  G02B6/12

CPC classification number: G01J3/457 ,  G01J3/0297 ,  G01J3/18 ,  G01J3/2803 ,  G01J2003/1861 ,  G01J2003/2866 ,  G02B6/12

Abstract: A light wavelength measurement method of measuring a wavelength of target light includes: receiving target light on a second dispersion device that disperses the target light into a plurality of second beams which reach a plurality of positions corresponding to the wavelength of the target light (S106, S202); and measuring the wavelength of the target light, by using the plurality of the second beams as a vernier scale for measuring the wavelength of the target light within a wavelength range specified by a main scale (S108, S204).

公开(公告)号：US10481004B2

公开(公告)日：2019-11-19

申请号：US15812049

申请日：2017-11-14

Applicant: OSAKA UNIVERSITY

Inventor： Tsuyoshi Konishi ,  Takema Satoh ,  Tomotaka Nagashima

IPC: G01J3/457 ,  G01J3/18 ,  G01J3/28 ,  G01J3/02 ,  G02B6/12

Abstract: A light wavelength measurement method of measuring a wavelength of target light includes: receiving target light on a second dispersion device that disperses the target light into a plurality of second beams which reach a plurality of positions corresponding to the wavelength of the target light; and measuring the wavelength of the target light, by using the plurality of the second beams as a vernier scale for measuring the wavelength of the target light within a wavelength range specified by a main scale.