公开(公告)号：US10481004B2

公开(公告)日：2019-11-19

申请号：US15812049

申请日：2017-11-14

Applicant: OSAKA UNIVERSITY

Inventor： Tsuyoshi Konishi ,  Takema Satoh ,  Tomotaka Nagashima

IPC: G01J3/457 ,  G01J3/18 ,  G01J3/28 ,  G01J3/02 ,  G02B6/12

Abstract: A light wavelength measurement method of measuring a wavelength of target light includes: receiving target light on a second dispersion device that disperses the target light into a plurality of second beams which reach a plurality of positions corresponding to the wavelength of the target light; and measuring the wavelength of the target light, by using the plurality of the second beams as a vernier scale for measuring the wavelength of the target light within a wavelength range specified by a main scale.

公开(公告)号：US20150010303A1

公开(公告)日：2015-01-08

申请号：US14379806

申请日：2013-02-06

Applicant: OSAKA UNIVERSITY

Inventor： Tsuyoshi Konishi ,  Koji Takahashi ,  Tomotaka Nagashima

IPC: H04B10/079 ,  H04B10/25

CPC classification number: H04B10/07955 ,  G01J11/00 ,  H04B10/25

Abstract: A waveform reconstruction device (140) includes: a phase-spectrum calculation unit (143) which (i) simulates, for each intensity of an input optical signal assumed to have a given phase spectrum, propagation of the input optical signal through an optical transmission medium, to calculate a power spectrum of an output optical signal, and (ii) performs iterations of simulating the propagation while changing the given phase spectrum to reduce differences between calculated power spectra and measured power spectra of the input optical signal having the intensities, to search for a phase spectrum of the input optical signal; and a waveform reconstruction unit (144) which reconstructs a time waveform of the input optical signal using the phase spectrum found through the search, wherein the phase-spectrum calculation unit (143) changes the given phase spectrum or simulates the propagation, based on a nonlinear optical effect or a dispersion effect.

Abstract translation: 波形重建装置（140）包括：相位谱计算单元（143），其对（假定具有给定相位谱的输入光信号的每个强度）模拟通过光传输的输入光信号的传播 介质，以计算输出光信号的功率谱，以及（ii）在改变给定相位频谱的同时进行模拟传播的迭代，以减少计算的功率谱与具有强度的输入光信号的测量功率谱之间的差异，以便 搜索输入光信号的相位谱; 以及波形重建单元（144），其使用通过搜索找到的相位频谱来重构输入光信号的时间波形，其中相位频谱计算单元（143）基于相位谱计算单元（143）改变给定的相位谱或模拟传播， 非线性光学效应或分散效应。

公开(公告)号：US09337922B2

公开(公告)日：2016-05-10

申请号：US14379806

申请日：2013-02-06

Applicant: OSAKA UNIVERSITY

Inventor： Tsuyoshi Konishi ,  Koji Takahashi ,  Tomotaka Nagashima

IPC: H04B10/00 ,  H04B10/079 ,  G01J11/00 ,  H04B10/25

CPC classification number: H04B10/07955 ,  G01J11/00 ,  H04B10/25

Abstract: A waveform reconstruction device (140) includes: a phase-spectrum calculation unit (143) which (i) simulates, for each intensity of an input optical signal assumed to have a given phase spectrum, propagation of the input optical signal through an optical transmission medium, to calculate a power spectrum of an output optical signal, and (ii) performs iterations of simulating the propagation while changing the given phase spectrum to reduce differences between calculated power spectra and measured power spectra of the input optical signal having the intensities, to search for a phase spectrum of the input optical signal; and a waveform reconstruction unit (144) which reconstructs a time waveform of the input optical signal using the phase spectrum found through the search, wherein the phase-spectrum calculation unit (143) changes the given phase spectrum or simulates the propagation, based on a nonlinear optical effect or a dispersion effect.

Abstract translation: 波形重建装置（140）包括：相位谱计算单元（143），其对（假定具有给定相位谱的输入光信号的每个强度）模拟通过光传输的输入光信号的传播 介质，以计算输出光信号的功率谱，以及（ii）在改变给定相位频谱的同时进行模拟传播的迭代，以减少计算的功率谱与具有强度的输入光信号的测量功率谱之间的差异，以便 搜索输入光信号的相位谱; 以及波形重建单元（144），其使用通过搜索找到的相位频谱来重构输入光信号的时间波形，其中相位频谱计算单元（143）基于相位谱计算单元（143）改变给定的相位谱或模拟传播， 非线性光学效应或分散效应。

公开(公告)号：US09846081B2

公开(公告)日：2017-12-19

申请号：US14775321

申请日：2014-03-10

Applicant: OSAKA UNIVERSITY

Inventor： Tsuyoshi Konishi ,  Takema Satoh ,  Tomotaka Nagashima

IPC: G01J3/28 ,  G01J3/457 ,  G01J3/18 ,  G01J3/02 ,  G02B6/12

CPC classification number: G01J3/457 ,  G01J3/0297 ,  G01J3/18 ,  G01J3/2803 ,  G01J2003/1861 ,  G01J2003/2866 ,  G02B6/12

Abstract: A light wavelength measurement method of measuring a wavelength of target light includes: receiving target light on a second dispersion device that disperses the target light into a plurality of second beams which reach a plurality of positions corresponding to the wavelength of the target light (S106, S202); and measuring the wavelength of the target light, by using the plurality of the second beams as a vernier scale for measuring the wavelength of the target light within a wavelength range specified by a main scale (S108, S204).