METHOD AND APPARATUS FOR DETECTING DEFECTS ON THE SURFACE OF A DATA RECORDING MEDIUM
    1.
    发明申请
    METHOD AND APPARATUS FOR DETECTING DEFECTS ON THE SURFACE OF A DATA RECORDING MEDIUM 审中-公开
    用于检测数据记录介质表面缺陷的方法和装置

    公开(公告)号:WO1997039365A1

    公开(公告)日:1997-10-23

    申请号:PCT/US1997005731

    申请日:1997-04-08

    Applicant: PHASE METRICS

    CPC classification number: G01R33/1207

    Abstract: A method and apparatus (60) for detecting defects on the surface of a data recording medium. In one embodiment the present invention includes a sensor (62) for detecting defects on the surface of a magnetic disk. The sensor (62) generates an analog voltage signal that is representative of a surface anomaly detected on the disk surface. An analog signal processor (64) processes the signal before it is received by a peak detecting circuit (68). The peak detecting circuit (68) detects and converts a peak of the analog signal into digital data. The digital data is received and manipulated by a digital signal processor (70) where the peak amplitude, average peak amplitude and average peak power of the defect may be calculated.

    Abstract translation: 一种用于检测数据记录介质表面上的缺陷的方法和装置(60)。 在一个实施例中,本发明包括用于检测磁盘表面上的缺陷的传感器(62)。 传感器(62)产生代表在盘表面上检测到的表面异常的模拟电压信号。 模拟信号处理器(64)在由峰值检测电路(68)接收之前处理该信号。 峰值检测电路(68)检测并将模拟信号的峰值转换为数字数据。 数字数据由数字信号处理器(70)接收和操纵,其中可以计算缺陷的峰值振幅,平均峰值振幅和平均峰值功率。

Patent Agency Ranking