公开(公告)号：JP2000132934A

公开(公告)日：2000-05-12

申请号：JP25399299

申请日：1999-09-08

Applicant: PHASE METRICS INC

Inventor： SEMION NODELMAN

IPC: G11B21/12 ,  G11B5/58

Abstract: PROBLEM TO BE SOLVED: To eliminate necessity for retracting a finger after loading the head by providing a base plate and a finger which is coupled to rotate to the base plate being coupled with a flexure arm at the position where it is never in contact with the upper edge of a rail. SOLUTION: A rotor 24 is provided with a finger 30 which is coupled to rotate with a base plate 26. The finger 30 is also coupled with a flexure arm 28 to surely prevent the head 14 to be in contact with a disc when a linear actuator moves the head 14 in the direction to cross the disc. The flexure arm 28 has a pair of bent rails 32 to increase rigidity. The finger 30 has the shape which disable the contact thereof with the upper edge of the bent rail 32 when the finger 30 is coupled with the flexure arm 28. The finger 30 has the thickness to make smaller the gap between the disc and the part of flexure arm 28 other than the rail when the head 14 is engaged with the disc.

公开(公告)号：JPH11232806A

公开(公告)日：1999-08-27

申请号：JP13962798

申请日：1998-05-21

Applicant: PHASE METRICS INC

Inventor： KARAM RAYMOND

IPC: G01B21/30 ,  G01B5/00 ,  G01B5/004 ,  G01N37/00 ,  G01Q10/04 ,  G01Q60/00 ,  G01Q80/00 ,  G11B5/455 ,  G11B5/48 ,  G11B5/55 ,  G11B21/00 ,  G11B21/02 ,  G11B27/36 ,  G11B33/10 ,  H01L41/09

Abstract: PROBLEM TO BE SOLVED: To reduce the amount of the movement, which is out of the plane along the housing z-axis of a transducer, during an assembling and to accurately and speedingly conduct a device positioning by generating the movement of the housing along an x-axis or a y-axis caused by the expansion or the contraction of the transducer. SOLUTION: At the time of assembling an electrical/mechanical transducer 22 into a housing 12, the transducer 22 is mounted onto a deflection joint insert 30 to produce a single subassembly and the subassembly is inserted into an opening section 14. Then, an electric field is applied to the transducer 22 to measure the amount of the movement of the housing 12. Then, the insert 30 is moved in the section 14. Then, an electric field is applied to the transducer 22 to measure the amount of the movement of the housing 12. The above processes are repeated for several moved positions of the insert 30, the data are analyzed and the position of the insert 30, where the amount of the movement in the z-axis direction becomes a minimum, is determined.

公开(公告)号：JPH10320943A

公开(公告)日：1998-12-04

申请号：JP6294498

申请日：1998-03-13

Applicant: PHASE METRICS INC

Inventor： ALEX MORALEU ,  BLASSTIMIL SEJINA ,  MICHAEL INVER ,  KEN WOMACK ,  ROBIN SWEYN

IPC: G11B21/10

Abstract: PROBLEM TO BE SOLVED: To facilitate writing into a wide clock track by a method wherein writing or stamping is applied to the reference surface of a magnetic memory disc while the magnetic memory disc is fixed to a head disc which is approximately enclosed and a clock track is read and a servo track is written through the window of a head disc assembly. SOLUTION: A reference head 122 writes a reference track on a disc 112 by using an instruction generated by a reference and pattern generating board 134. Then a clock head 124 writes a clock track by using the output of the reference head 122 and the transition timing of the clock track is matched and transitions of different clock parts are properly properly arranged. The clock writing position is monitored by a laser position transducer which has a laser 144 using an interferometer construction and a clock track with a width of several hundreds μm can be generated.

公开(公告)号：JP2000011569A

公开(公告)日：2000-01-14

申请号：JP13713999

申请日：1999-05-18

Applicant: PHASE METRICS INC

Inventor： JEFFREY K LOTON

IPC: G11B21/10

Abstract: PROBLEM TO BE SOLVED: To attain the write-in on plural disks by providing a mandrel constituted so as to receive at least two disks, a spacer for separating two disks and a fastener for fixing the disks to the mandrel. SOLUTION: The plural disks 16 rotated by a spindle motor 14 are supported with a chuck assembly 12. The disks 16 and the spacers 28 are clamped to a pole 20 of the mandrel 18 by the fastener 30 mounted on a pin 24. The chuck assembly 12 includes further a cap 32 positioned between the fastener 30 and the uppermost disk 16. A centering pole 34 is arranged in a cavity 35 of a base part 22 of the mandrel 18 to make the centering of the chuck assembly 12 against the spindle motor 14. The centering pole 34 is joined to a pin 36 pressed into a groove hole 25 and aligned to the pin 24 and the disks 16.

公开(公告)号：JPH1166227A

公开(公告)日：1999-03-09

申请号：JP15259998

申请日：1998-06-02

Applicant: PHASE METRICS INC

Inventor： PHILIP GREGORY ROBERTS

IPC: G06K9/20 ,  G11B5/127

Abstract: PROBLEM TO BE SOLVED: To eliminate the need for precise control over the position of a substrate by providing light sources which are arranged in an arcuate array. SOLUTION: An optical character recognition(OCR) system has one illuminator array 110 and a camera 120. The camera 120 is placed at an angle θ with respect to the normal of a target 130. The camera 120 has a lens 122, having a visual field for reading a mark etched on the surface of the target 130. An image of the mark is formed on a lens 122 as a result of light being reflected by the surface of the target 130. The illuminator array 110 is placed at a proper position on the x-y plane of a three-dimensional positioning system. The illuminator array 110 is arranged in arcuate array and provides illumination light for the target 130 on the surface of a slider. The illuminator array 110 consists of plural light sources 112a to 112n for emitting light beams 114a to 114n respectively, and the respective light sources are arranged at a distance S from adjacent light sources.

公开(公告)号：JP2001050903A

公开(公告)日：2001-02-23

申请号：JP2000185724

申请日：2000-06-21

Applicant: PHASE METRICS INC

Inventor： CHEN LI ,  CHHIBBER RAJ

IPC: G01N21/95 ,  G01N21/958 ,  G11B5/84

Abstract: PROBLEM TO BE SOLVED: To achieve effective inspection by reflecting light from a laser light source on first and second surfaces and filtering light being reflected from the second surface with a spatial filter for detecting by a first photodetector. SOLUTION: An optical inspection system 10 consist of a laser 18 for reflecting a light beam 20 from a substrate 12, a spatial filter 28, a lens assembly 38, and the like. The substrate 12 reflects one portion 24 of light on a first surface 14 and one portion 26 of light on a second surface 16. The spatial filter 28 for filtering light on the second surface is set to a constriction with an opaque part 30, and the constriction includes an opening 32 for transmitting the light 24 up to first and second photodetectors 34 and 36. Reflection light from the second surface 16 enters a lens assembly 38 at an angle that differs from that of the reflection light 24 from the first surface 14 according to factors such as an incidence angle ϕ of a light beam 20, the thickness of a substrate 12, a refractive index, or the like. A control device 52 processes the output signals of the first and second photo detectors 34 and 36 to determine the characteristics of the certain surface of the substrate 12.

公开(公告)号：WO1997034124A1

公开(公告)日：1997-09-18

申请号：PCT/US1997003814

申请日：1997-03-12

Applicant: PHASE METRICS, INC.

Inventor： PHASE METRICS, INC. ,  BREZOCZKY, Blasius ,  POGREBINSKY, Vladimir

IPC: G01C09/02

CPC classification number: G01N21/88

Abstract: An automatic surface inspection apparatus (10) comprises a light source (12) that provides a coherent light beam (20) that is split (14) and then recombined in a prism (21) to generate an interference pattern. A cylindrical lens (26) projects the interference pattern onto the surface of a disk (30) as a line of light (50). A linear detection array (45) converts the reflected line of light into an electrical signal that has a magnitude which varies dependent upon the reflected light intensity. Defects present on the surface of the disk cause variations in the reflected light intensity manifested as differences in the electrical signal output by the detection array (45).

Abstract translation: 自动表面检查装置（10）包括提供相干光束（20）的光源（12），所述相干光束（20）被分离（14），然后在棱镜（21）中重新组合以产生干涉图案。 柱面透镜（26）将干涉图案作为光线（50）突出到盘（30）的表面上。 线性检测阵列（45）将反射的光线转换成具有取决于反射光强度而变化的幅度的电信号。 存在于盘的表面上的缺陷导致反射光强度的变化，表现为由检测阵列（45）输出的电信号的差异。

公开(公告)号：WO1997027467A1

公开(公告)日：1997-07-31

申请号：PCT/US1997000992

申请日：1997-01-27

Applicant: PHASE METRICS

Inventor： PHASE METRICS ,  JANN, Peter, C. ,  CEINA, Vlastimil ,  CORMIER, Art

IPC: G01N21/00

CPC classification number: B82Y15/00 ,  G01N21/9506

Abstract: An optical scanner (22) scanning disks (2) or other materials connected to a microscope (32, 35-38) or other inspection device, providing the location of defects, flaws and events to the microscope (32, 35-38), facilitating defect location and analysis. In some embodiments, the microscope (32, 35-38) may be replaced with an electron microscope or an atomic force microscope, or other advanced image analysis. In some embodiments, information regarding the defect is provided to a manufacturing function automatically and quickly, thus preventing problems that might arise due to delays in communication. In some embodiments the disks (2) on which defects are found are physically moved to a remote microscope location, while in other embodiments the scanner (22) and microscope (32, 35-38) are located along the path (57) on which all disks (2) are transported.

Abstract translation: 光学扫描器（22）扫描盘（2）或连接到显微镜（32,35-38）或其它检查装置的其他材料，以将缺陷，缺陷和事件的位置提供给显微镜（32,35-38）， 促进缺陷位置和分析。 在一些实施例中，显微镜（32,35-38）可以用电子显微镜或原子力显微镜或其他高级图像分析来代替。 在一些实施例中，关于缺陷的信息被自动且快速地提供给制造功能，从而防止由于通信延迟而可能出现的问题。 在一些实施例中，找到缺陷的盘（2）被物理地移动到远程显微镜位置，而在其他实施例中，扫描器（22）和显微镜（32,35-38）沿着其上的路径（57） 所有磁盘（2）都被运送。

公开(公告)号：WO1997026529A1

公开(公告)日：1997-07-24

申请号：PCT/US1997000825

申请日：1997-01-17

Applicant: PHASE METRICS

Inventor： PHASE METRICS ,  JANN, Peter, C. ,  LI, Wayne, W. ,  IOSILEVSKY, Igor ,  WOMACK, Kenneth, H. ,  CEJNA, Vlastimil ,  BURT, George, A., Jr.

IPC: G01N21/47

CPC classification number: G01N21/9501 ,  G01N21/94 ,  G01N2201/1045

Abstract: A simple yet versatile noncontact optical inspection instrument and method for inspection of magnetic disk surfaces for surface defects. The instrument is also capable of discriminating between surface defects and surface contaminants. The instrument is comprised of two identical optical sensors (12) which are located on opposite sides of the disk (16). A carriage (14) supports and translates these sensors (12) along the disk radius while a spindle rotates the disk (16). Both surfaces of the disk (16) are therefore simultaneously scanned in a spiral fashion. The sensor's illumination optics produce a monochromatic focused spot of light which is normally incident upon the disk surface. The sensor uses two collection optics channels which simultaneously detect both the specular reflected light and the diffuse scattered light produced by the disk (16) surface. Both the angle and power of the specular reflected light are measured, while just the power of the diffuse scattered light is measured.

Abstract translation: 一种简单而通用的非接触光学检测仪器和用于检查表面缺陷的磁盘表面的方法。 该仪器还能够区分表面缺陷和表面污染物。 该仪器由两个相同的光学传感器（12）组成，它们位于盘（16）的相对侧上。 当主轴旋转盘（16）时，托架（14）沿着盘半径支撑和平移这些传感器（12）。 因此，盘（16）的两个表面因此以螺旋方式同时扫描。 传感器的照明光学器件产生通常入射在盘表面上的单色聚光光点。 该传感器使用两个收集光学通道，其同时检测镜面反射光和由盘（16）表面产生的漫射散射光。 测量镜面反射光的角度和功率，同时测量漫射散射光的功率。

公开(公告)号：WO1997017696A1

公开(公告)日：1997-05-15

申请号：PCT/US1996018094

申请日：1996-11-08

Applicant: PHASE METRICS

Inventor： PHASE METRICS ,  INBAR, Michael

IPC: G11B05/02

CPC classification number: H03D1/2281 ,  G01R33/1207 ,  G11B5/012 ,  G11B20/1816 ,  G11B27/36 ,  G11B33/10

Abstract: An apparatus and method for demodulating an amplitude modulated read signal generated by a magnetic head (12) of a hard disk drive. The apparatus includes a pair of serially connected track and hold circuits (16, 20) that receive the read signal. The track or hold state of each circuit is controlled by a phase lock loop circuit (24) which also receives the read signal. The first track and hold circuit initially tracks the read signal to a peak value. The second track and hold circuit tracks the output of the first circuit. The output signals are compared to a threshold value to detect bit errors in the signal. The constant output signals provide additional energy to the detection circuit to minimize the number of false error signals from the comparator circuit (32).

Abstract translation: 一种用于解调由硬盘驱动器的磁头（12）产生的调幅读信号的装置和方法。 该装置包括一对串行连接的跟踪和保持电路（16,20），其接收读取信号。 每个电路的跟踪或保持状态由也接收读取信号的锁相环电路（24）控制。 第一个跟踪和保持电路首先将读取的信号跟踪到一个峰值。 第二轨道和保持电路跟踪第一电路的输出。 将输出信号与阈值进行比较，以检测信号中的位错误。 恒定输出信号为检测电路提供额外的能量以最小化来自比较器电路（32）的误差信号的数量。